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  1. 原著論文

Surface processing of PMMA and metal nano-particle resist by sub-micrometer focusing of coherent extreme ultraviolet high-order harmonics pulses

https://repo.qst.go.jp/records/79993
https://repo.qst.go.jp/records/79993
38cd85e5-886c-46a5-8262-d6fb4f8b65fd
Item type 学術雑誌論文 / Journal Article(1)
公開日 2020-04-03
タイトル
タイトル Surface processing of PMMA and metal nano-particle resist by sub-micrometer focusing of coherent extreme ultraviolet high-order harmonics pulses
言語
言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_6501
資源タイプ journal article
アクセス権
アクセス権 metadata only access
アクセス権URI http://purl.org/coar/access_right/c_14cb
著者 Sakaue, Kazuyuki

× Sakaue, Kazuyuki

WEKO 869960

Sakaue, Kazuyuki

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Motoyama, Hiroto

× Motoyama, Hiroto

WEKO 869961

Motoyama, Hiroto

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Hayashi, Ryosuke

× Hayashi, Ryosuke

WEKO 869962

Hayashi, Ryosuke

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Iwasaki, Atsushi

× Iwasaki, Atsushi

WEKO 869963

Iwasaki, Atsushi

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Mimura, Hidekazu

× Mimura, Hidekazu

WEKO 869964

Mimura, Hidekazu

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Yamanochi, Kaoru

× Yamanochi, Kaoru

WEKO 869965

Yamanochi, Kaoru

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Shibuya, Tatsunori

× Shibuya, Tatsunori

WEKO 869966

Shibuya, Tatsunori

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Ishino, Masahiko

× Ishino, Masahiko

WEKO 869967

Ishino, Masahiko

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Dinh, Thanhhung

× Dinh, Thanhhung

WEKO 869968

Dinh, Thanhhung

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Ogawa, Hiroshi

× Ogawa, Hiroshi

WEKO 869969

Ogawa, Hiroshi

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Higashiguchi, Takeshi

× Higashiguchi, Takeshi

WEKO 869970

Higashiguchi, Takeshi

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Nishikino, Masaharu

× Nishikino, Masaharu

WEKO 869971

Nishikino, Masaharu

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Kuroda, Ryunosuke

× Kuroda, Ryunosuke

WEKO 869972

Kuroda, Ryunosuke

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Ishino, Masahiko

× Ishino, Masahiko

WEKO 869973

en Ishino, Masahiko

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Dinh, Thanhhung

× Dinh, Thanhhung

WEKO 869974

en Dinh, Thanhhung

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Nishikino, Masaharu

× Nishikino, Masaharu

WEKO 869975

en Nishikino, Masaharu

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抄録
内容記述タイプ Abstract
内容記述 We demonstrated sub-micrometer processing of two kinds of thin films, polymethyl methacrylate (PMMA) and metal nano-particle resist, by focusing high-order harmonics of near-IR femtosecond laser pulses in the extreme ultraviolet (XUV) wavelength region (27.2 – 34.3 nm) on the thin film samples using an ellipsoidal focusing mirror. The ablation threshold fluences for the PMMA sample and the metal nano-particle resist per XUV pulse obtained by the accumulation of 200 XUV pulses were determined to be 0.24 mJ/cm2 and 0.10 mJ/cm2, respectively. The diameters (FWHM) of a hole created by the ablation on the PMMA film at the focus were 0.67 and 0.44 μm along the horizontal and vertical directions, respectively. The fluence dependence of Raman microscope spectra of the processed holes on the PMMA sample showed that the chemical modification, in which C=C double bonds are formed associated with the scission of the PMMA polymer chains, is achieved by the irradiation of the XUV pulses.
書誌情報 Optics Letters

巻 45, 号 10, p. 2926-2929, 発行日 2020-06
ISSN
収録物識別子タイプ ISSN
収録物識別子 0146-9592
DOI
識別子タイプ DOI
関連識別子 10.1364/OL.392695
関連サイト
識別子タイプ URI
関連識別子 https://www.osapublishing.org/ol/abstract.cfm?uri=ol-45-10-2926
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