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セシウム含有モンモリロナイトの軟X線放射光光電子分光
https://repo.qst.go.jp/records/79782
https://repo.qst.go.jp/records/79782859af350-78a9-4da1-8c01-182618bc2be2
Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2020-04-02 | |||||
タイトル | ||||||
タイトル | セシウム含有モンモリロナイトの軟X線放射光光電子分光 | |||||
言語 | ||||||
言語 | jpn | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
アクセス権 | ||||||
アクセス権 | metadata only access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
著者 |
寺岡, 有殿
× 寺岡, 有殿× Teraoka, Yuuden |
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抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | High resolution photoemission spectroscopy with soft X-ray synchrotron radiation has been applied to montmorillonite, one of phyllosilicate compounds. Charge build-up is inevitable in the powder sample due to its insulating property so that photoemission peaks of element components are difficult to be assigned. On the other hand, photoemission peaks have been observed at their original peak positions without the charge shift. These non-shifted peaks enabled determination of binding energies of element components. Information on chemical bonding states of cesium, adsorbed artificially in the montmorillonite, has been also obtained. | |||||
書誌情報 |
電気学会論文誌C 巻 140, 号 4, p. 412-416, 発行日 2020-04 |
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出版者 | ||||||
出版者 | 電気学会 | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 0385-4221 | |||||
DOI | ||||||
識別子タイプ | DOI | |||||
関連識別子 | 10.1541/ieejeiss.140.412 | |||||
関連サイト | ||||||
識別子タイプ | URI | |||||
関連識別子 | https://www.jstage.jst.go.jp/article/ieejeiss/140/4/140_412/_article/-char/ja |