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  1. 原著論文

Lamellar orientation of a block copolymer via an electron-beam induced polarity switch in a nitrophenyl self-assembled monolayer or a Si etching treatments

https://repo.qst.go.jp/records/79722
https://repo.qst.go.jp/records/79722
bbeff368-713d-4580-bcfe-9d8fade38e63
アイテムタイプ 学術雑誌論文 / Journal Article(1)
公開日 2020-03-30
タイトル
タイトル Lamellar orientation of a block copolymer via an electron-beam induced polarity switch in a nitrophenyl self-assembled monolayer or a Si etching treatments
言語
言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_6501
資源タイプ journal article
アクセス権
アクセス権 metadata only access
アクセス権URI http://purl.org/coar/access_right/c_14cb
著者 Yamamoto, Hiroki

× Yamamoto, Hiroki

WEKO 861485

Yamamoto, Hiroki

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Dawson, Guy

× Dawson, Guy

WEKO 861486

Dawson, Guy

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Kozawa, Takahiro

× Kozawa, Takahiro

WEKO 861487

Kozawa, Takahiro

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P. G. Robinson, Alex

× P. G. Robinson, Alex

WEKO 861488

P. G. Robinson, Alex

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Yamamoto, Hiroki

× Yamamoto, Hiroki

WEKO 861489

en Yamamoto, Hiroki

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内容記述タイプ Abstract
内容記述 Directed self-assembly (DSA) was investigated on self-assembled monolayers (SAMs) chemically modified by electron beam (EB) irradiation, which is composed of 6-(4-nitrophenoxy) hexane-1-thiol (NPHT). Irradiating a NPHT by EB could successfully induce the orientation and selective patterning of block copolymer domains. We clarified that spatially-selective lamellar orientations of polystyrene-block-poly(methyl methacrylate) (PS-b-PMMA) could be achieved by a change of an underlying SAM. The change of an underlying SAM is composed of the transition of an NO2 group to an NH2 group, which is induced by EB. The modification in the polarity of different regions of the SAM with EB lithography controlled the lamellar orientation of PS-b-PMMA. The reduction of the NPHT SAM plays an important role in the orientation of block copolymer. This method might significantly simplify block copolymer DSA processes when it is compared to the conventional DSA process. By investigating the lamellae orientation with EB, it is clarified that only suitable annealing temperatures and irradiation doses lead to the vertical orientation. We also fabricated pre-patterned Si substrates by EB lithographic patterning and reactive ion etching (RIE). DSA onto such pre-patterned Si substrates was proven to be successful for subdivision of the lithographic patterns into line and space patterns.
書誌情報 Quantum Beam Sci.

巻 4, 号 2, p. 19-1, 発行日 2020-03
ISSN
収録物識別子タイプ ISSN
収録物識別子 2412-382X
DOI
識別子タイプ DOI
関連識別子 10.3390/qubs4020019
関連サイト
識別子タイプ URI
関連識別子 https://www.mdpi.com/2412-382X/4/2/19
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