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Fluorescent Defect Formation in Single Crystalline Diamond by Focused Proton Irradiation
https://repo.qst.go.jp/records/78276
https://repo.qst.go.jp/records/78276fa900aec-e002-48dd-8dd7-eaf0804c0b20
| Item type | 会議発表用資料 / Presentation(1) | |||||
|---|---|---|---|---|---|---|
| 公開日 | 2019-12-28 | |||||
| タイトル | ||||||
| タイトル | Fluorescent Defect Formation in Single Crystalline Diamond by Focused Proton Irradiation | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_c94f | |||||
| 資源タイプ | conference object | |||||
| アクセス権 | ||||||
| アクセス権 | metadata only access | |||||
| アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
| 著者 |
Kada, W.
× Kada, W.× Haruyama, M.× Higuchi, Taisei× Suda, Y.× Onoda, Shinobu× Ohshima, Takeshi× Miura, K.× Hanaizumi, O.× Higuchi, Taisei× Onoda, Shinobu× Ohshima, Takeshi |
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| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | Creation of fluorescent defects at desired position and structures will play an important role for development of quantum devices. Compared to other microfabrication techniques, focused particle beam is excellent tool for defect engineering on wide band-gap semiconductors. There are several studies on micro-processing using various focused particle beam writing (PBW) techniques and some among them successfully demonstrated fabrication of graphite structures in diamond. Recently, we succeeded to control the depth of the micrometer-scaled processed layer by changing energy of the focused ions.These techniques would be applicable to form defects of fluorescent centers in diamond by precise control of PBW microprobe. | |||||
| 会議概要（会議名, 開催地, 会期, 主催者等） | ||||||
| 内容記述タイプ | Other | |||||
| 内容記述 | 23rd International Workshop on Inelastic Ion-Surface Collisions (IISC-23) | |||||
| 発表年月日 | ||||||
| 日付 | 2019-11-18 | |||||
| 日付タイプ | Issued | |||||
