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Effects of Resonance Phenomenon caused by Power Supply on JT-60SA CS
https://repo.qst.go.jp/records/77277
https://repo.qst.go.jp/records/772776a57346c-65e6-4593-be73-6e1b97e5da81
| Item type | 会議発表用資料 / Presentation(1) | |||||
|---|---|---|---|---|---|---|
| 公開日 | 2019-11-01 | |||||
| タイトル | ||||||
| タイトル | Effects of Resonance Phenomenon caused by Power Supply on JT-60SA CS | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_c94f | |||||
| 資源タイプ | conference object | |||||
| アクセス権 | ||||||
| アクセス権 | metadata only access | |||||
| アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
| 著者 |
Meguro, Hirotaka
× Meguro, Hirotaka× Nakamura, Kazuya× Sonoda, Shogo× Nasu, Keisuke× Murakami, Haruyuki× Kizu, Kaname× Murakami, Haruyuki× Kizu, Kaname |
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| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | The maximum voltage between the CS module terminals is designed to be 10 kV, the voltage between the layers under ideal conditions is then about 0.38 kV because the CS module has 52 layers. But, in operating condition, there is a possibility that the voltage between the layers is higher than 0.38 kV due to the voltage fluctuations of the power supply and the inhomogeneous voltage distribution in the CS module induced by the resonance phenomenon. The JT-60SA CS consists of four electrically independent stacked CS modules. It might even produce voltages high enough to damage the insulation between the CS conductors, and thus affect the operation of the JT-60SA CS. In the present study, which is based on the results of previous studies, we created a circuit simulation model for the JT-60SA CS (four CS modules), including the structures (ground resistances, CS structure, TFC cases, and EFC covers), and used it to estimate the voltage distribution produced by the resonance phenomenon. From these results, we conclude that the resonance phenomenon caused by power supply frequency components does not impact the insulation between the CS conductors, and hence the JT-60SA CS is electrically stable under normal operating conditions. | |||||
| 会議概要（会議名, 開催地, 会期, 主催者等） | ||||||
| 内容記述タイプ | Other | |||||
| 内容記述 | 第26回国際磁石技術会議（MT26 International Conference on Magnet Technology） | |||||
| 発表年月日 | ||||||
| 日付 | 2019-09-23 | |||||
| 日付タイプ | Issued | |||||
