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Development of soft x-ray laser irradiation beamline for damage examination of soft x-ray/EUV optics

https://repo.qst.go.jp/records/76920
https://repo.qst.go.jp/records/76920
e3970a77-c9bc-44e3-b15d-b12dea6cacab
Item type 会議発表用資料 / Presentation(1)
公開日 2019-04-15
タイトル
タイトル Development of soft x-ray laser irradiation beamline for damage examination of soft x-ray/EUV optics
言語
言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_c94f
資源タイプ conference object
アクセス権
アクセス権 metadata only access
アクセス権URI http://purl.org/coar/access_right/c_14cb
著者 石野, 雅彦

× 石野, 雅彦

WEKO 792236

石野, 雅彦

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タンフン, ヂン

× タンフン, ヂン

WEKO 792237

タンフン, ヂン

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長谷川, 登

× 長谷川, 登

WEKO 792238

長谷川, 登

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錦野, 将元

× 錦野, 将元

WEKO 792239

錦野, 将元

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Ishino, Masahiko

× Ishino, Masahiko

WEKO 792240

en Ishino, Masahiko

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Dinh, Thanhhung

× Dinh, Thanhhung

WEKO 792241

en Dinh, Thanhhung

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Hasegawa, Noboru

× Hasegawa, Noboru

WEKO 792242

en Hasegawa, Noboru

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Nishikino, Masaharu

× Nishikino, Masaharu

WEKO 792243

en Nishikino, Masaharu

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抄録
内容記述タイプ Abstract
内容記述 The soft x-ray laser (SXRL) is one of attractive x-ray source for ablation study, because the ablation threshold obtained with the focused SXRL pulse having the wavelength of 13.9 nm and duration of 7 ps is much smaller than those obtained with other lasers having longer durations and/or longer wavelengths. The low ablation threshold of a material for the SXRL beam has a possibility of efficient nanometer scale surface direct machining by an ablation. In addition, the wavelength of the SXRL is very close to the wavelength of the extreme ultraviolet lithography system (λ = 13.5 nm). So, the SXRL has an ability not only to confirm the ablation threshold but also to examine the damage property of the extreme ultraviolet (EUV) optical elements, which have the same specifications of those in the EUV lithography. To examine the damage threshold and/or durability of EUV optical elements, we develop the soft x-ray laser irradiation system. The irradiation system has an intensity monitor based on the Mo/Si multilayer beam splitter. This intensity monitor provides the irradiation energy onto sample surface.
会議概要(会議名, 開催地, 会期, 主催者等)
内容記述タイプ Other
内容記述 The 11th International Conference on Inertial Fusion Sciences and Applications (IFSA 2019)
発表年月日
日付 2019-09-24
日付タイプ Issued
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