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Development of an apparatus for Bragg coherent X-ray diffraction imaging, and its application to the three dimensional imaging of BaTiO3 nano-crystals
https://repo.qst.go.jp/records/76562
https://repo.qst.go.jp/records/7656259063690-dea7-44dd-9404-ca15d38464dc
| Item type | 学術雑誌論文 / Journal Article(1) | |||||
|---|---|---|---|---|---|---|
| 公開日 | 2019-06-11 | |||||
| タイトル | ||||||
| タイトル | Development of an apparatus for Bragg coherent X-ray diffraction imaging, and its application to the three dimensional imaging of BaTiO3 nano-crystals | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
| 資源タイプ | journal article | |||||
| アクセス権 | ||||||
| アクセス権 | metadata only access | |||||
| アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
| 著者 |
Owada, Kenji
× Owada, Kenji× Sugawara, Kento× Abe, Tomohiro× Ueno, Tetsuro× Machida, Akihiko× Watanuki, Tetsu× Ueno, Shintaro× Fujii, Ichiro× Wada, Satoshi× Kuroiwa, Yoshihiro× Owada, Kenji× Sugawara, Kento× Ueno, Tetsuro× Machida, Akihiko× Watanuki, Tetsu |
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| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | We report the developmental status of the apparatus of the Bragg coherent X-ray diffraction imaging (Bragg-CDI) method at BL22XU of SPring-8 and show some typical results of the three dimensional imaging of BaTiO$_{3}$ fine particles obtained by using the apparatus. We chose two types of samples, cubic-like shaped sample and sample rich in curved surfaces. The shape and the size of the particles were expectedly reconstructed. They are approximately consistent with the results by the SEM measurements. The information of the inside and backside could be obtained, which could not be obtained by the SEM measurements. The size of the particle which we can measure is about to reach to 100~nm or smaller, now. The Bragg-CDI method is a powerful technique to investigate the crystalline particles, furthermore will open the avenue to measure particles in devices such as inside the MLCC devices which cannot be measured by using the electron beam. | |||||
| 書誌情報 |
Japanese Journal of Applied Physics (Special Issues: Ferroelectric Materials and Their Applications) 巻 58, 号 SL, p. SLLA05, 発行日 2019-08 |
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| 出版者 | ||||||
| 出版者 | IOP | |||||
| ISSN | ||||||
| 収録物識別子タイプ | ISSN | |||||
| 収録物識別子 | 0021-4922 | |||||
| DOI | ||||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | 10.7567/1347-4065/ab38dd | |||||
| 関連サイト | ||||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | https://doi.org/10.7567/1347-4065/ab38dd | |||||
