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Fluorescent imaging of heavy charged particle tracks with LiF single crystals
https://repo.qst.go.jp/records/75973
https://repo.qst.go.jp/records/75973444f932f-51e4-4435-9da0-294f76e0f713
Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2019-06-04 | |||||
タイトル | ||||||
タイトル | Fluorescent imaging of heavy charged particle tracks with LiF single crystals | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
アクセス権 | ||||||
アクセス権 | metadata only access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
著者 |
Paweł, Bilski
× Paweł, Bilski× Marczewska, Barbara× Gieszczyk, Wojciech× Mariusz, Kłosowski× Michał, Naruszewicz× Małgorzata, Sankowska× Kodaira, Satoshi× Satoshi, Kodaira |
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抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | Radiophotoluminescence of F2 and F3 + color centers in LiF was exploited for imaging tracks of energetic heavy charged particles. LiF crystals were irradiated with helium, carbon, neon, silicon and iron ions at the HIMAC accelerator in Chiba, Japan. The patterns created by radiation were visualized with a wide-field fluorescent microscope under blue-light excitation. The shape of the visible tracks was found not to depend on ion type and energy. The full width at half maximum of track profiles was in all cases around 500 nm, what corresponds with the resolution limit of the microscope, which was estimated to be 420 nm. On the other hand the fluorescent intensity of tracks was found to increase in a linear manner with the increasing LET. This indicates possibility of obtaining some spectrometric information on the radiation field. | |||||
書誌情報 |
Journal of Luminescence 巻 213, p. 82-87, 発行日 2019-05 |
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出版者 | ||||||
出版者 | ELSEVIER | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 0022-2313 | |||||
DOI | ||||||
識別子タイプ | DOI | |||||
関連識別子 | 10.1016/j.jlumin.2019.05.007 | |||||
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識別子タイプ | DOI | |||||
関連識別子 | https://doi.org/10.1016/j.jlumin.2019.05.007 |