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Tearing Mode Locking Avoidance by Applying Rotating External 3D Field
https://repo.qst.go.jp/records/74922
https://repo.qst.go.jp/records/74922ac12af67-8645-46a2-b1a4-b58d228a4b5e
Item type | 会議発表用資料 / Presentation(1) | |||||
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公開日 | 2019-03-25 | |||||
タイトル | ||||||
タイトル | Tearing Mode Locking Avoidance by Applying Rotating External 3D Field | |||||
言語 | ||||||
言語 | jpn | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_c94f | |||||
資源タイプ | conference object | |||||
アクセス権 | ||||||
アクセス権 | metadata only access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
著者 |
Okabayashi, M.
× Okabayashi, M.× Inoue, S.× Strait, T.× Taylor, Z.× Ferraro, N.× Logan, N.× Jardin, S.× Inoe, Shizuo |
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抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | Recent cylindrical non-linear reduced MHD simulation by S. Inoue (PPCF(2018)) has demonstrated a possibility of “shielding-out” error field by applying a rotating 3D field, weakening significantly a single-helicity 2/1 LM. DIII-D experiments in a toroidal geometry supports his proposal, but toroidicity and shaping introduce coupling of multiple poloidal Fourier modes. The applied n=1 fields include several poloidal components even for m/n=2/1 LM avoidance, and produce shielding-like response where q≥3 and weak response inside of q<3. This suggests the 1/1 and 2/1 resonant components are shielded-out. In the 3D feedback for LM avoidance produces the edge tearing RMP in such a way that edge RMP appearance coincides in time with disappearance of inner RMP. The relative dependence of the tearing and shielded response on the frequency of the applied field and other physical parameters will be discussed in a qualitative manner with the M3DC1 code, using both one- and two-fluid models. This work is supported in part by the US Department of Energy under DE-AC02-09CH11466, DE-FG02-99ER54531. | |||||
会議概要(会議名, 開催地, 会期, 主催者等) | ||||||
内容記述タイプ | Other | |||||
内容記述 | 60th Annual Meeting of the APS Division of Plasma Physics | |||||
発表年月日 | ||||||
日付 | 2018-11-07 | |||||
日付タイプ | Issued |