ログイン
言語:

WEKO3

  • トップ
  • ランキング
To
lat lon distance
To

Field does not validate



インデックスリンク

インデックスツリー

メールアドレスを入力してください。

WEKO

One fine body…

WEKO

One fine body…

アイテム

  1. 学会発表・講演等
  2. ポスター発表

Effects of High Gamma-Ray Radiation on 3C-SiC nMOSFETs

https://repo.qst.go.jp/records/74794
https://repo.qst.go.jp/records/74794
b6e304de-5e85-492e-8d54-017aa049779a
Item type 会議発表用資料 / Presentation(1)
公開日 2019-03-17
タイトル
タイトル Effects of High Gamma-Ray Radiation on 3C-SiC nMOSFETs
言語
言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_c94f
資源タイプ conference object
アクセス権
アクセス権 metadata only access
アクセス権URI http://purl.org/coar/access_right/c_14cb
著者 Shin-Ichiro, Kuroki

× Shin-Ichiro, Kuroki

WEKO 737917

Shin-Ichiro, Kuroki

Search repository
Nagano, Kohei

× Nagano, Kohei

WEKO 737918

Nagano, Kohei

Search repository
Meguro, Tatsuya

× Meguro, Tatsuya

WEKO 737919

Meguro, Tatsuya

Search repository
Takeyama, Akinori

× Takeyama, Akinori

WEKO 737920

Takeyama, Akinori

Search repository
Makino, Takahiro

× Makino, Takahiro

WEKO 737921

Makino, Takahiro

Search repository
Ohshima, Takeshi

× Ohshima, Takeshi

WEKO 737922

Ohshima, Takeshi

Search repository
Tanaka, Yasunori

× Tanaka, Yasunori

WEKO 737923

Tanaka, Yasunori

Search repository
Takeyama, Akinori

× Takeyama, Akinori

WEKO 737924

en Takeyama, Akinori

Search repository
Makino, Takahiro

× Makino, Takahiro

WEKO 737925

en Makino, Takahiro

Search repository
Ohshima, Takeshi

× Ohshima, Takeshi

WEKO 737926

en Ohshima, Takeshi

Search repository
抄録
内容記述タイプ Abstract
内容記述 For the decommissioning operations for the Fukushima Daiich plants, many robots have been installed, however the operation time is limited by particularly image sensors, because it is difficult to sheild the sensors from radiation. 3C-Silicon carbide (SiC) have absorbance to visible light and there is a possibility to integrate 3C-SiC photodiodes and 3C-SiC MOSFETs in the same 3C-SiC substrate for the radiation hardened image sensors. In this work, 3C-SiC nMOSFETs were fabricated and its radiation hardness was investigated. Fabricated 3C-SiC MOSFETs show the threshold voltage of 5.8V, electron field-effect mobility of 44.6 cm2/V・s. After the gamma-ray irradiation of 2.01 MGy, the electron field effect mobility was almost the same as that before irradiation. Although the threshold voltage decreased from 5.8 to 2.7 V, irradiated device worked well after irradiation. It demonstarets 3C-SiC MOSFETs have a potential to be a base transistor for radiation-hardened image sensors.
会議概要(会議名, 開催地, 会期, 主催者等)
内容記述タイプ Other
内容記述 European Conference on Silicon Carbide and Related Materials (ECSCRM 2018)
発表年月日
日付 2018-09-04
日付タイプ Issued
戻る
0
views
See details
Views

Versions

Ver.1 2023-05-15 19:02:39.812125
Show All versions

Share

Mendeley Twitter Facebook Print Addthis

Cite as

エクスポート

OAI-PMH
  • OAI-PMH JPCOAR 2.0
  • OAI-PMH JPCOAR 1.0
  • OAI-PMH DublinCore
  • OAI-PMH DDI
Other Formats
  • JSON
  • BIBTEX

Confirm


Powered by WEKO3


Powered by WEKO3