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A profile analysis method for high-intensity DC beams using a thermographic camera

https://repo.qst.go.jp/records/71284
https://repo.qst.go.jp/records/71284
a2700987-259a-466e-93f3-cc83156832af
Item type 会議発表用資料 / Presentation(1)
公開日 2013-10-10
タイトル
タイトル A profile analysis method for high-intensity DC beams using a thermographic camera
言語
言語 jpn
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_c94f
資源タイプ conference object
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アクセス権 metadata only access
アクセス権URI http://purl.org/coar/access_right/c_14cb
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WEKO 700794

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内容記述タイプ Abstract
内容記述 A new analysis method for the digital-image processing apparatus has been developed to evaluate profiles of high-intensity DC beams from temperature images of irradiated-thin foils. Numerical calculations were performed to examine the reliability and the performance of the profile analysis method. To simulate the temperature images acquired by a thermographic camera, temperature distributions were numerically calculated for various beam parameters. The noises in the temperature images, which are added by the camera sensor, were also simulated to be taken its effect into account. By using the profile analysis method, the beam profiles were evaluated from the simulated-temperature images, and they were compared with the exact solution of the beam profiles. We found that the profile analysis method is adaptable over a wide beam current range of ~0.1 - 10 microA, even if a general-purpose thermographic camera with rather high noise (NETD ~ 0.3 K, NETD: Noise Equivalent Temperature Difference) is employed.
会議概要(会議名, 開催地, 会期, 主催者等)
内容記述タイプ Other
内容記述 20th International Conference on Cyclotrons and their Applications
発表年月日
日付 2013-09-20
日付タイプ Issued
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