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A profile analysis method for high-intensity DC beams using a thermographic camera
https://repo.qst.go.jp/records/71284
https://repo.qst.go.jp/records/71284a2700987-259a-466e-93f3-cc83156832af
Item type | 会議発表用資料 / Presentation(1) | |||||
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公開日 | 2013-10-10 | |||||
タイトル | ||||||
タイトル | A profile analysis method for high-intensity DC beams using a thermographic camera | |||||
言語 | ||||||
言語 | jpn | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_c94f | |||||
資源タイプ | conference object | |||||
アクセス権 | ||||||
アクセス権 | metadata only access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
著者 |
片桐, 健
× 片桐, 健× 片桐 健 |
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抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | A new analysis method for the digital-image processing apparatus has been developed to evaluate profiles of high-intensity DC beams from temperature images of irradiated-thin foils. Numerical calculations were performed to examine the reliability and the performance of the profile analysis method. To simulate the temperature images acquired by a thermographic camera, temperature distributions were numerically calculated for various beam parameters. The noises in the temperature images, which are added by the camera sensor, were also simulated to be taken its effect into account. By using the profile analysis method, the beam profiles were evaluated from the simulated-temperature images, and they were compared with the exact solution of the beam profiles. We found that the profile analysis method is adaptable over a wide beam current range of ~0.1 - 10 microA, even if a general-purpose thermographic camera with rather high noise (NETD ~ 0.3 K, NETD: Noise Equivalent Temperature Difference) is employed. | |||||
会議概要(会議名, 開催地, 会期, 主催者等) | ||||||
内容記述タイプ | Other | |||||
内容記述 | 20th International Conference on Cyclotrons and their Applications | |||||
発表年月日 | ||||||
日付 | 2013-09-20 | |||||
日付タイプ | Issued |