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Behavior of radiation defects on Output Performance of Quantum Structure Solar Cells

https://repo.qst.go.jp/records/66250
https://repo.qst.go.jp/records/66250
fed229a0-8aec-4b01-9343-cb3e031d7d96
Item type 会議発表用資料 / Presentation(1)
公開日 2017-03-29
タイトル
タイトル Behavior of radiation defects on Output Performance of Quantum Structure Solar Cells
言語
言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_c94f
資源タイプ conference object
アクセス権
アクセス権 metadata only access
アクセス権URI http://purl.org/coar/access_right/c_14cb
著者 佐藤, 真一郎

× 佐藤, 真一郎

WEKO 651907

佐藤, 真一郎

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Oshima, Takeshi

× Oshima, Takeshi

WEKO 651908

Oshima, Takeshi

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Schmieder, Kenneth

× Schmieder, Kenneth

WEKO 651909

Schmieder, Kenneth

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Warner, Jeffrey

× Warner, Jeffrey

WEKO 651910

Warner, Jeffrey

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Walters, Robert

× Walters, Robert

WEKO 651911

Walters, Robert

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Hubbard, Seth

× Hubbard, Seth

WEKO 651912

Hubbard, Seth

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Forbes, David

× Forbes, David

WEKO 651913

Forbes, David

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佐藤 真一郎

× 佐藤 真一郎

WEKO 651914

en 佐藤 真一郎

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大島 武

× 大島 武

WEKO 651915

en 大島 武

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内容記述タイプ Abstract
内容記述 In order to expand the technology of III-V semiconductor devices with quantum structures to both terrestrial and space use, radiation induced defects as well as native defects generated in the quantum structures should be clarified. Electrically active defects in GaAs pn diodes with embedded ten layers of InAs quantum dots (QDs) are investigated using Deep Level Transient Fourier Spectroscopy. Both majority carrier (electron) and minority carrier (hole) traps are characterized. In the devices of this study, GaP layers are embedded in between the QD layers to offset the compressive stress introduced during growth of InAs QDs. Devices are irradiated with high energy protons for three different fluences at room temperature in order to characterize radiation induced defects. Seven majority electron traps and one minority hole trap are found after proton irradiation. It is shown that four electron traps induced by proton irradiation increase in proportion to the fluence, whereas the EL2 trap, which appears before irradiation, is not affected by irradiation. These defects correspond to electron traps previously identified in GaAs. In addition, a 0.53 eV electron trap and a 0.14 eV hole trap are found in the QD layers before proton irradiation. It is shown that these native traps are also unaffected by irradiation. The nature of the 0.14 eV hole trap is thought to be Ga-vacancies in the GaP strain balancing layers.
会議概要(会議名, 開催地, 会期, 主催者等)
内容記述タイプ Other
内容記述 19th Workshop on Space Solar Cell Calibration and Measurement Techniques
発表年月日
日付 2016-11-17
日付タイプ Issued
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