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Very high energy calibration of silicon Timepix detectors
https://repo.qst.go.jp/records/49556
https://repo.qst.go.jp/records/4955610c7f563-b1dd-461e-9c61-a81d3bbb6c27
| Item type | 学術雑誌論文 / Journal Article(1) | |||||
|---|---|---|---|---|---|---|
| 公開日 | 2019-02-06 | |||||
| タイトル | ||||||
| タイトル | Very high energy calibration of silicon Timepix detectors | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
| 資源タイプ | journal article | |||||
| アクセス権 | ||||||
| アクセス権 | metadata only access | |||||
| アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
| 著者 |
George, S.P.
× George, S.P.× Kroupa, M.× Wheeler, S.× Kodaira, S.× Kitamura, H.× Tlustos, L.× T., Campbell-Ricketts× Stoffle, N.N.× Semones, E.× Pinsky, L.× Kodaira, Satoshi× Kitamura, Hisashi |
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| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | We investigate energy measurements in Timepix hybrid detectors in hole collection mode above pixel input energy depositions of about 2:2 MeV or 600,000 electron/hole pairs in Silicon. Measurement of the detector response well above this regime is important for our application measuring the heavy ion exposure of NASA astronauts. We find that high input charges produce a double pulse structure in the Timepix front end which creates a taxonomy of different clusters which are observed at accelerators, but not in typical operation on orbit. We investigate the LET response of the Timepix to different heavy ion species and find that for a given polar angle the so called ‘volcano effect’ can be compensated with a simple power law model. We also characterize the pixel response of the Timepix using mono-energetic stopping protons and derive a per pixel calibration method for correction of the pixel response up to about 8 MeV. We conclude that with an appropriate calibration procedure the Timepix can correctly measure the LET values in excess of 500 keVμm????1 in Silicon for tracks with a polar angle exceeding 60°, corresponding to the entirety of the cosmic ray spectrum up to Nickel. |
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| 書誌情報 |
Journal of Instrumentation 巻 13, 号 11, p. P11014, 発行日 2018-11 |
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| 出版者 | ||||||
| 出版者 | IOP Publishing | |||||
| ISSN | ||||||
| 収録物識別子タイプ | ISSN | |||||
| 収録物識別子 | 1748-0221 | |||||
| DOI | ||||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | 10.1088/1748-0221/13/11/P11014 | |||||
| 関連サイト | ||||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | https://doi.org/10.1088/1748-0221/13/11/P11014 | |||||
