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Evaluation of Voltage Between Conductors for Resonance Phenomenon and Transient Response in JT-60SA Central Solenoid
https://repo.qst.go.jp/records/49530
https://repo.qst.go.jp/records/4953027d364f9-4b74-48b3-a06c-bb293777ecb8
| Item type | 学術雑誌論文 / Journal Article(1) | |||||
|---|---|---|---|---|---|---|
| 公開日 | 2019-02-01 | |||||
| タイトル | ||||||
| タイトル | Evaluation of Voltage Between Conductors for Resonance Phenomenon and Transient Response in JT-60SA Central Solenoid | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
| 資源タイプ | journal article | |||||
| アクセス権 | ||||||
| アクセス権 | metadata only access | |||||
| アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
| 著者 |
Nakamura, Kazuya
× Nakamura, Kazuya× Fujiyama, Sho× Nasu, Keisuke× Meguro, Hirotaka× Takao, Tomoaki× Murakami, Haruyuki× Natsume, Kyohei× Kizu, Kaname× Murakami, Haruyuki× Natsume, Kyohei× Kizu, Kaname |
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| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | An inhomogeneous voltage distribution in the coil is induced by the resonance phenomenon and transient response caused by the power supply. Therefore, damage to the insulation between conductors in the coils is possible. We created the circuit simulation models of the central solenoid (CS) module (the 52-layer pancake coil) with the room-temperature busbar and superconducting current feeder between the power supply and CS module. Then,we evaluated the behavior of the voltage between the conductors for the resonance phenomenon and transient response caused by the supply voltage in theCS module. Based on the results, we can conclude that the influences of resonance phenomenon and transient response on the voltage between the conductors in the CS module is negligibly small under the expected operating conditions. These results therefore represent important information for the safe operation of the JT-60SA. | |||||
| 書誌情報 |
IEEE Transactions on Applied Superconductivity 巻 28, 号 3, p. 4201205, 発行日 2018-04 |
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| 出版者 | ||||||
| 出版者 | IEEE | |||||
| ISSN | ||||||
| 収録物識別子タイプ | ISSN | |||||
| 収録物識別子 | 1051-8223 | |||||
| DOI | ||||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | 10.1109/TASC.2017.2780049 | |||||
