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  1. 原著論文

Drastic decrease of carbonyl group after the loss of ether in PADC exposed to 222 nm UV photons

https://repo.qst.go.jp/records/49404
https://repo.qst.go.jp/records/49404
0d7b2f62-3bed-41e5-95ba-f2c7de0ac4a0
Item type 学術雑誌論文 / Journal Article(1)
公開日 2019-01-07
タイトル
タイトル Drastic decrease of carbonyl group after the loss of ether in PADC exposed to 222 nm UV photons
言語
言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_6501
資源タイプ journal article
アクセス権
アクセス権 metadata only access
アクセス権URI http://purl.org/coar/access_right/c_14cb
著者 Kusumoto , Tamon

× Kusumoto , Tamon

WEKO 1071006

Kusumoto , Tamon

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Mori, Yutaka

× Mori, Yutaka

WEKO 1071007

Mori, Yutaka

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Kanzaki, Masato

× Kanzaki, Masato

WEKO 1071008

Kanzaki, Masato

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Oda, Keiji

× Oda, Keiji

WEKO 1071009

Oda, Keiji

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Kodaira, Satoshi

× Kodaira, Satoshi

WEKO 1071010

Kodaira, Satoshi

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Rémi, Barillon

× Rémi, Barillon

WEKO 1071011

Rémi, Barillon

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Yamauchi, Tomoya

× Yamauchi, Tomoya

WEKO 1071012

Yamauchi, Tomoya

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Tamon, Kusumoto

× Tamon, Kusumoto

WEKO 1071013

en Tamon, Kusumoto

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Satoshi, Kodaira

× Satoshi, Kodaira

WEKO 1071014

en Satoshi, Kodaira

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抄録
内容記述タイプ Abstract
内容記述 We aim to elucidate the chemical damage structure in poly(allyl diglycol carbonate), PADC, exposed to UV photons with a wavelength of 222 nm using FT-IR spectrometric method. The number density of carbonyl (C˭O) in PADC, which composes carbonate ester, is hardly affected by the UV photons below the critical fluence of 3.0 × 1019 photons/cm2. The number density of carbonyl decreases only above the critical fluence, while those of ether and C-O-C in carbonate ester are monotonically cleaved. These findings corroborate the previous result using 28 MeV electron beams, in which the carbonate ester is lost only above the critical fluence of 1.6 × 1015 electrons/cm2, where the overlapping of electron tracks becomes significant. We extend the conventional track overlapping model to clarify the spatial distribution of point-like defects after the UV exposure. The discrete damage is seen at the critical condition, based on the extended track overlapping model.
書誌情報 Radiation Physics and Chemistry

巻 157, p. 60-64, 発行日 2019-01
出版者
出版者 ELSEVIER
ISSN
収録物識別子タイプ ISSN
収録物識別子 0969-806X
DOI
識別子タイプ DOI
関連識別子 10.1016/j.radphyschem.2018.12.018
関連サイト
識別子タイプ DOI
関連識別子 https://doi.org/10.1016/j.radphyschem.2018.12.018
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