ログイン
言語:

WEKO3

  • トップ
  • ランキング
To
lat lon distance
To

Field does not validate



インデックスリンク

インデックスツリー

メールアドレスを入力してください。

WEKO

One fine body…

WEKO

One fine body…

アイテム

  1. 原著論文

Vertical-type two-dimensional hole gas diamond metal oxide semiconductor field-effect transistors

https://repo.qst.go.jp/records/49307
https://repo.qst.go.jp/records/49307
ad27cc6b-996f-4d36-950d-6c984c4f753a
Item type 学術雑誌論文 / Journal Article(1)
公開日 2019-02-18
タイトル
タイトル Vertical-type two-dimensional hole gas diamond metal oxide semiconductor field-effect transistors
言語
言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_6501
資源タイプ journal article
アクセス権
アクセス権 metadata only access
アクセス権URI http://purl.org/coar/access_right/c_14cb
著者 Oi, Nobutaka

× Oi, Nobutaka

WEKO 723905

Oi, Nobutaka

Search repository
Masafumi Inaba

× Masafumi Inaba

WEKO 723906

Masafumi Inaba

Search repository
Okubo, Satoshi

× Okubo, Satoshi

WEKO 723907

Okubo, Satoshi

Search repository
Tsuyuzaki, Ikuto

× Tsuyuzaki, Ikuto

WEKO 723908

Tsuyuzaki, Ikuto

Search repository
Kageura, Taisuke

× Kageura, Taisuke

WEKO 723909

Kageura, Taisuke

Search repository
Onoda, Shinobu

× Onoda, Shinobu

WEKO 723910

Onoda, Shinobu

Search repository
Hiraiwa, Atsushi

× Hiraiwa, Atsushi

WEKO 723911

Hiraiwa, Atsushi

Search repository
Kawarada, Hiroshi

× Kawarada, Hiroshi

WEKO 723912

Kawarada, Hiroshi

Search repository
小野田 忍

× 小野田 忍

WEKO 723913

en 小野田 忍

Search repository
抄録
内容記述タイプ Abstract
内容記述 Power semiconductor devices require low on-resistivity and high breakdown voltages simultaneously. Vertical-type metal-oxide-semiconductor field-effect transistors (MOSFETs) meet these requirements, but have been incompleteness in diamond. Here we show vertical-type p-channel diamond MOSFETs with trench structures and drain current densities equivalent to those of n-channel wide bandgap devices for complementary inverters. We use two-dimensional hole gases induced by atomic layer deposited Al2O3 for the channel and drift layers, irrespective of their crystal orientations. The source and gate are on the planar surface, the drift layer is mainly on the sidewall and the drain is the p+ substrate. The maximum drain current density exceeds 200 mA mm−1 at a 12 µm source-drain distance. On/off ratios of over eight orders of magnitude are demonstrated and the drain current reaches the lower measurement limit in the off-state at room temperature using a nitrogen-doped n-type blocking layer formed using ion implantation and epitaxial growth.
書誌情報 Scientific Reports

巻 8, 号 1, p. 10660, 発行日 2018-07
DOI
識別子タイプ DOI
関連識別子 10.1038/s41598-018-28837-5
戻る
0
views
See details
Views

Versions

Ver.1 2023-05-15 19:29:35.587902
Show All versions

Share

Mendeley Twitter Facebook Print Addthis

Cite as

エクスポート

OAI-PMH
  • OAI-PMH JPCOAR 2.0
  • OAI-PMH JPCOAR 1.0
  • OAI-PMH DublinCore
  • OAI-PMH DDI
Other Formats
  • JSON
  • BIBTEX

Confirm


Powered by WEKO3


Powered by WEKO3