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Total-reflection high-energy positron diffraction (TRHEPD) for structure determination of the topmost and immediate sub-surface atomic layers
https://repo.qst.go.jp/records/49230
https://repo.qst.go.jp/records/4923031aa01c1-10c2-4124-94fc-b7bc753f0054
Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2018-11-01 | |||||
タイトル | ||||||
タイトル | Total-reflection high-energy positron diffraction (TRHEPD) for structure determination of the topmost and immediate sub-surface atomic layers | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
アクセス権 | ||||||
アクセス権 | metadata only access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
著者 |
深谷, 有喜
× 深谷, 有喜× 河裾, 厚男× 一宮, 彪彦× 兵頭, 俊夫× 河裾 厚男 |
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抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | Total-reflection high-energy positron diffraction (TRHEPD) has recently been developed to investigate the surface structure (atomic geometry) and surface properties of materials. It is the positron (the antiparticle of the electron) counterpart of reflection high-energy electron diffraction (RHEED). Depending on the glancing angle of incidence, positrons are totally reflected from the surface or shallowly penetrate into the bulk of the sample solid. Thus, it is possible to obtain information about the topmost and immediate sub-surface layers without the background effect of the bulk. In this review, this distinctive feature of the TRHEPD process and some of the results on surface structures and characteristics are described. | |||||
書誌情報 |
Journal of Physics D: Applied Physics 巻 52, p. 013002-19, 発行日 2018-10 |
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出版者 | ||||||
出版者 | IOP Publishing | |||||
DOI | ||||||
識別子タイプ | DOI | |||||
関連識別子 | 10.1088/1361-6463/aadf14 | |||||
関連サイト | ||||||
識別子タイプ | URI | |||||
関連識別子 | http://iopscience.iop.org/article/10.1088/1361-6463/aadf14/meta | |||||
関連名称 | http://iopscience.iop.org/article/10.1088/1361-6463/aadf14/meta |