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Hillocks created for amorphizable and non-amorphazable ceramics irradiated with swift heavy ions: TEM study
https://repo.qst.go.jp/records/49042
https://repo.qst.go.jp/records/4904213754a27-8787-4392-8a24-72d0e67ae64a
Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2018-05-18 | |||||
タイトル | ||||||
タイトル | Hillocks created for amorphizable and non-amorphazable ceramics irradiated with swift heavy ions: TEM study | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
アクセス権 | ||||||
アクセス権 | metadata only access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
著者 |
石川, 法人
× 石川, 法人× 田口, 富嗣× 大久保, 成彰× 田口 富嗣 |
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抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | In a previous study, we found that hillocks (i.e. surface ion tracks) can be imaged using transmission electron microscopy (TEM) by irradiating thin CeO2 samples with swift heavy ions (SHI) at oblique incidence. In the present study, the same TEM method is applied to Y3Fe5O12 (YIG) and three fluorides (CaF2, SrF2 and BaF2) for observing hillocks. For YIG, which is one of the amorphizable materials, hillocks are found to have amorphous features consistent with amorphous features of ion tracks. For the fluorides, it is found that the hillocks do not exhibit amorphous features, and they are composed of nanocrystallites. Although hillocks for YIG and CaF2 exhibit different crystallographic features, hillock diameter agrees with the molten region diameter predicted by the thermal spike model for both materials. It is found that for YIG the hillock diameter is comparable to the ion track diameter, whereas for the fluorides it is always larger than the ion track diameter. The present result shows the existence of the velocity effect for ion track diameter in CaF2. It is also found that for fluorides both hillock and ion track diameters vary in the order of cation mass (i.e. CaF2 < SrF2 < BaF2). The above results of hillocks and ion tracks for SHI-irradiated fluorides can be consistently interpreted within the framework of the thermal spike model, if melting and successive recrystallization are assumed. | |||||
書誌情報 |
Nanotechnology 巻 28, 号 44, p. 445708, 発行日 2017-10 |
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出版者 | ||||||
出版者 | IOP SCIENCE | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 0957-4484 | |||||
DOI | ||||||
識別子タイプ | DOI | |||||
関連識別子 | 10.1088/1361-6528/aa8778 | |||||
関連サイト | ||||||
識別子タイプ | URI | |||||
関連識別子 | http://iopscience.iop.org/article/10.1088/1361-6528/aa8778/meta | |||||
関連名称 | http://iopscience.iop.org/article/10.1088/1361-6528/aa8778/meta |