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  1. 原著論文

Stark Tuning and Electrical Charge State Control of Single Divacancies in Silicon Carbide

https://repo.qst.go.jp/records/48511
https://repo.qst.go.jp/records/48511
10c4ca0a-b7e2-4f04-984e-eb06f9755da3
Item type 学術雑誌論文 / Journal Article(1)
公開日 2018-02-15
タイトル
タイトル Stark Tuning and Electrical Charge State Control of Single Divacancies in Silicon Carbide
言語
言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_6501
資源タイプ journal article
アクセス権
アクセス権 metadata only access
アクセス権URI http://purl.org/coar/access_right/c_14cb
著者 F., de las Casas Charles

× F., de las Casas Charles

WEKO 487658

F., de las Casas Charles

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J., Christle David

× J., Christle David

WEKO 487659

J., Christle David

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Ul, Hassan Jawad

× Ul, Hassan Jawad

WEKO 487660

Ul, Hassan Jawad

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Ohshima, Takeshi

× Ohshima, Takeshi

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Ohshima, Takeshi

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T., Son Nguyen

× T., Son Nguyen

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T., Son Nguyen

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D., Awschlom David

× D., Awschlom David

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D., Awschlom David

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大島 武

× 大島 武

WEKO 487664

en 大島 武

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内容記述タイプ Abstract
内容記述 Neutrally charged divacancies in silicon carbide (SiC) which are known as paramagnetic color centers, their long coherence times and near-telecom operating wavelengths. However, local strain inhomogeneity can randomly perturb their optical transition frequencies, which degrades the indistinguishability of photons emitted from separate defects and hinders their coupling to optical cavities. In this study, electric fields can be used to tune the optical transition frequencies of single neutral divacancy defects in 4H-SiC over a range of several GHz via the DC Stark effect. The same technique can also control the charge state of the defect on microsecond timescales. Using fluorescence-based charge state detection, it is demonstrated that both 975 and 1130 nm excitation can prepare their neutral charge state with near unity efficiency.
書誌情報 Applied Physics Letter

巻 111, 号 26, p. 262403-1-262403-5, 発行日 2017-12
出版者
出版者 American Institute of Physics
DOI
識別子タイプ DOI
関連識別子 10.1063/1.5004174
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