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  1. 原著論文

Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm

https://repo.qst.go.jp/records/48021
https://repo.qst.go.jp/records/48021
1a6a9615-197a-4184-8b35-2ac2b214460f
Item type 学術雑誌論文 / Journal Article(1)
公開日 2017-06-05
タイトル
タイトル Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm
言語
言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_6501
資源タイプ journal article
アクセス権
アクセス権 metadata only access
アクセス権URI http://purl.org/coar/access_right/c_14cb
著者 Dinh, Thanhhung

× Dinh, Thanhhung

WEKO 482022

Dinh, Thanhhung

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Yamamoto, Yoichi

× Yamamoto, Yoichi

WEKO 482023

Yamamoto, Yoichi

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Ishino, Masahiko

× Ishino, Masahiko

WEKO 482024

Ishino, Masahiko

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Nishikino, Masaharu

× Nishikino, Masaharu

WEKO 482025

Nishikino, Masaharu

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タンフン ヂン

× タンフン ヂン

WEKO 482026

en タンフン ヂン

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山本 洋一

× 山本 洋一

WEKO 482027

en 山本 洋一

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石野 雅彦

× 石野 雅彦

WEKO 482028

en 石野 雅彦

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錦野 将元

× 錦野 将元

WEKO 482029

en 錦野 将元

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抄録
内容記述タイプ Abstract
内容記述 A flat-field grazing incidence spectrometer operating on the spectral region from 1 to 10 nm was built for research on physics of high temperature and high energy density plasmas. It consists of a flat-field grating with 2400 lines/mm as a dispersing element and an x-ray charged coupled device (CCD) camera as the detector. The diffraction efficiency of the grating and the sensitivity of the CCD camerawere directly measured by use of synchrotron radiation at the BL-11D beamline of the Photon Factory (PF). The influence of contamination to the spectrometer also was characterized. This result enables us to evaluate the absolute number of photons in a wide range wavelength between 1 and 10 nm within an acquisition. We obtained absolutely calibrated spectra from highly charged ion plasmas of Gd, from which a maximum energy conversion efficiency of 0.26% was observed at a Nd:YAG laser intensity of 3 × 1012 W/cm2.
書誌情報 Review of Scientific Instruments

巻 87, 号 12, p. 123106-1-123106-7, 発行日 2016-12
出版者
出版者 AIP Publishing
DOI
識別子タイプ DOI
関連識別子 10.1063/1.4971421
関連サイト
識別子タイプ URI
関連識別子 http://aip.scitation.org/doi/10.1063/1.4971421
関連名称 http://aip.scitation.org/doi/10.1063/1.4971421
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