WEKO3
アイテム
Coherent X-ray beam metrology using 2D high-resolution Fresnel-diffraction analysis
https://repo.qst.go.jp/records/48019
https://repo.qst.go.jp/records/4801925d67112-a2da-4772-ba76-81e779af9650
| Item type | 学術雑誌論文 / Journal Article(1) | |||||
|---|---|---|---|---|---|---|
| 公開日 | 2017-06-05 | |||||
| タイトル | ||||||
| タイトル | Coherent X-ray beam metrology using 2D high-resolution Fresnel-diffraction analysis | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
| 資源タイプ | journal article | |||||
| アクセス権 | ||||||
| アクセス権 | metadata only access | |||||
| アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
| 著者 |
Ruiz-Lopez, M.
× Ruiz-Lopez, M.× Faenov, A.× Pikuz, T.× Ozaki, N.× Mitrofanov, A.× Albertazzi, B.× Hartley, N.× Matsuoka, T.× Ochante, Y.× Tange, Y.× Yabuuchi, T.× Habara, T.× A., Tanaka K.× Inubushi, Y.× Yabashi, M.× Nishikino, M.× Kawachi, T.× Pikuz, S.× Ishikawa, T.× Kodama, R.× 錦野 将元× 河内 哲哉 |
|||||
| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | Direct metrology of coherent short-wavelength beamlines is important for obtaining operational beam characteristics at the experimental site. However, since beam-time limitation imposes fast metrology procedures, a multi- parametric metrology from as low as a single shot is desirable. Here a two- dimensional (2D) procedure based on high-resolution Fresnel diffraction analysis is discussed and applied, which allowed an efficient and detailed beamline characterization at the SACLA XFEL. So far, the potential of Fresnel diffraction for beamline metrology has not been fully exploited because its high- frequency fringes could be only partly resolved with ordinary pixel-limited detectors. Using the high-spatial-frequency imaging capability of an irradiated LiF crystal, 2D information of the coherence degree, beam divergence and beam quality factor M2 were retrieved from simple diffraction patterns. The developed beam metrology was validated with a laboratory reference laser, and then successfully applied at a beamline facility, in agreement with the source specifications. | |||||
| 書誌情報 |
Journal of Synchrotron Radiation 巻 24, 号 1, p. 196-204, 発行日 2017-01 |
|||||
| 出版者 | ||||||
| 出版者 | International Union of Crystallography | |||||
| DOI | ||||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | 10.1107/s1600577516016568 | |||||
