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In situ ion-beam-induced luminescence analysis for evaluating a micrometer-scale radio-photoluminescence glass dosimeter
https://repo.qst.go.jp/records/47914
https://repo.qst.go.jp/records/479145f29f15a-aea3-40f6-9eef-6527f5a4e359
Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2017-05-01 | |||||
タイトル | ||||||
タイトル | In situ ion-beam-induced luminescence analysis for evaluating a micrometer-scale radio-photoluminescence glass dosimeter | |||||
言語 | ||||||
言語 | jpn | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
アクセス権 | ||||||
アクセス権 | metadata only access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
著者 |
Kawabata, Shunsuke
× Kawabata, Shunsuke× Kada, Wataru× Kumar, Parajuli Raj× Matsubara, Yoshinori× Sakai, Makoto× Miura, Kenta× Satoh, Takahiro× Koka, Masashi× Yamada, Naoto× Kamiya, Tomihiro× Hanaizumi, Osamu× 佐藤 隆博× 山田 尚人× 神谷 富裕 |
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抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | Micrometer-scale responses of radio-photoluminescence (RPL) glass dosimeters to focused ionized particle radiation were evaluated by combining ion-beam-induced luminescence (IBIL) and proton beam writing (PBW) using a 3MeV focused proton microbeam. RPL phosphate glass dosimeters doped with ionic Ag or Cu activators at concentrations of 0.2 and 0.1% were fabricated, and their scintillation intensities were evaluated by IBIL spectroscopy under a PBW micropatterning condition. Compared with the Ag-doped dosimeter, the Cu-doped dosimeter was more tolerant of the radiation, while the peak intensity of its luminescence was lower, under the precise dose control of the proton microprobe. Proton-irradiated areas were successfully recorded using these dosimeters and their RPL centers were visualized under 375 nm ultraviolet light. The reproduction of the irradiated region by post-RPL imaging suggests that precise estimation of irradiation dose using microdosimeters can be accomplished by optimizing RPL glass dosimeters for various proton microprobe applications in organic material analysis and in micrometer-scale material modifications. | |||||
書誌情報 |
Japanese Journal of Applied Physics 巻 55, 号 6S1, p. 06GD03-1-06GD03-4, 発行日 2016-06 |
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出版者 | ||||||
出版者 | IOP Publishing | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 0021-4922 | |||||
DOI | ||||||
識別子タイプ | DOI | |||||
関連識別子 | 10.7567/JJAP.55.06GD03 | |||||
関連サイト | ||||||
識別子タイプ | DOI | |||||
関連識別子 | https://doi.org/10.7567/JJAP.55.06GD03 | |||||
関連名称 | https://doi.org/10.7567/JJAP.55.06GD03 |