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  1. 原著論文

Introduction of PIXE analysis system in NIRS

https://repo.qst.go.jp/records/43192
https://repo.qst.go.jp/records/43192
f8c019ce-c0c6-4415-9e87-40c3d6de9ee4
Item type 学術雑誌論文 / Journal Article(1)
公開日 2003-10-20
タイトル
タイトル Introduction of PIXE analysis system in NIRS
言語
言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_6501
資源タイプ journal article
アクセス権
アクセス権 metadata only access
アクセス権URI http://purl.org/coar/access_right/c_14cb
著者 Imaseki, Hitoshi

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Imaseki, Hitoshi

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内容記述タイプ Abstract
内容記述 In March 1999, electrostatic accelerator, Tandetron (Model 4117MC, High Voltage Engineering Europe Co.) was installed in the Electrostatic Accelerator Building for PIXE (Particle Induced X-ray Emission) analysis. The accelerating voltage is 0.4 to 1.7MV, and the maximum beam current is 5micro A at 3.4MeV. This system has three beam ports for different types of PIXE analysis: normal, micro-beam and in-air. The first beam port is used for normal PIXE. Since two types of X-ray detecting device, Si (Li) and CdZnTe detectors, are available here, elements from Na (Z=11) to U (Z=92) are detectable. Fifteen samples can semi automatically be measured at one time using a proton beam of optical beam size from 0.5 to 2.0 mm at 100 nA beam current. A quadrupole triplet magnet (Model OM2000, Oxford Micro beams, Ltd.) attached to the second beam port produces a proton micro-beam of square shape less than 1micron x 1 micron. Micro-beam scanning PIXE analysis is carried out with this beam at 50pA current and scanning area up to 2.0mm square. The in-air PIXE analysis is performed using the third beam port. The operation of this machine has been scheduled to start from April 2000 and is controlled by Division of Technology and Safety. Some results preliminarily obtained are also shorn.
書誌情報 International Journal of PIXE

巻 10, p. 77-90, 発行日 2001-01
ISSN
収録物識別子タイプ ISSN
収録物識別子 0129-0835
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