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Vanadium-related luminescence of 4H-SiC at elevated temperature

https://repo.qst.go.jp/records/2006904
https://repo.qst.go.jp/records/2006904
a842e735-7e1c-4166-bd68-67fd3fa57b1c
アイテムタイプ 会議発表用資料 / Presentation(1)
公開日 2024-08-29
タイトル
タイトル Vanadium-related luminescence of 4H-SiC at elevated temperature
言語 en
言語
言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_6670
資源タイプ conference poster
著者 Koichi Murata

× Koichi Murata

Koichi Murata

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Sato Shinichiro

× Sato Shinichiro

Sato Shinichiro

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Satoshi Asada

× Satoshi Asada

Satoshi Asada

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Saiki Seiichi

× Saiki Seiichi

Saiki Seiichi

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Masuyama Yuta

× Masuyama Yuta

Masuyama Yuta

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Ohshima Takeshi

× Ohshima Takeshi

Ohshima Takeshi

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Hidekazu Tsuchida

× Hidekazu Tsuchida

Hidekazu Tsuchida

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抄録
内容記述 Silicon carbide (SiC) has the great potential for quantum sensing, and the several spin defect candidates have been reported. The negatively charged silicon vacancy (VSi-) is one promising candidate, and it has been recently demonstrated that the VSi- based magnetic sensors can operate above 591 K, while the magnetic sensitivity at 549 K is reduced by half compared to that at 300 K [2]. An alternative candidate for spin defects includes vanadium (V4+) in its neutral state in 4H-SiC, which exhibits photoluminescence (PL) at a wavelength of 1.3 μm within the optical telecom O-band (original band) [3 - 5]. Although spin-state manipulation of the V4+ state has been realized at low temperatures [4], there is a room for further discussion regarding the electronic structure of V4+ and its optical properties. Here, we performed a PL study of V-doped 4H-SiC epi-layers over a wide temperature range. The V-doped 4H-SiC epitaxial layer was grown in a CVD reactor using liquid VCl4 as the V dopant source [6]. A 50 μm-thick V-doped layer (V: 3 × 1013 - 6× 1015 cm-3) was grown on a commercial n+ SiC (0001) substrate. The PL spectra from 80 to 673 K were obtained with the use of a 976 nm laser as the excitation source. While the luminescence intensity monotonically declined with elevating temperature, luminescence was detected even at 673 K. The decay curve of V4+ luminescence was also obtained using a long-pass filter (> 1150 nm) or a band-pass filter (1300 ± 50 nm) over the same temperature range. The decay curves of the V4+ luminescence appears to consist of two components with the optical lifetimes in the range of 10 - 150 ns and ~ μs. In this report, the luminescence mechanism of V-doped 4H-SiC will be discussed based on PL studies towards infrared emitters operating at elevated temperatures.
会議概要(会議名, 開催地, 会期, 主催者等)
内容記述 Defects in solids for quantum technologies
発表年月日
日付 2024-06-11
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