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電離放射線を照射したTK6細胞におけるゲノムDNA損傷の原子間力顕微鏡(AFM)による直接可視化

https://repo.qst.go.jp/records/2004952
https://repo.qst.go.jp/records/2004952
5345e5e4-fe4a-4f89-8d61-041889e4b864
アイテムタイプ 会議発表用資料 / Presentation(1)
公開日 2022-08-31
タイトル
タイトル 電離放射線を照射したTK6細胞におけるゲノムDNA損傷の原子間力顕微鏡(AFM)による直接可視化
言語 ja
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言語 jpn
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_c94f
資源タイプ conference presentation
著者 中野 敏彰

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中野 敏彰

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赤松 憲

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赤松 憲

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津田 雅貴

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津田 雅貴

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井出 博

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井出 博

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鹿園 直哉

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内容記述 Radiation-induced locally multiply damaged site in DNA (clustered DNA damage) is thought to be closely related to the biological effects of radiation. A method has been established to evaluate the complexity of clustered DNA damage (i.e. the number of lesions per damaged site) in genomic DNA extracted from TK6 cells irradiated with a low-dose ionizing radiation by atomic force microscopy (AFM). This was realized by isolating and concentrating the DNA molecules with lesions from the whole irradiated DNA molecules also containing intact ones. The purpose of this study is to estimate the level of damage clustering in vivo. We found that ionizing radiation (X-rays and Fe-ion beams) produced clustered DNA damage in TK6 cells, whereas Fenton's reagents did not find it in Fenton’s regent-treated DNA, highlighting the importance of clustered DNA damage as a signature of ionizing radiation. We further observed that Fe-ion beams (high-LET radiation) produced various types of clustered DNA damage with higher complexity consisting of more than 2 lesions, which were quite few in the case of X- rays. Surprisingly, analyses of repair of DNA damage revealed that non-DSB clustered DNA damage were repaired efficiently in TK6 cells after irradiation of either X-rays and Fe-ion beams. The repair efficiency of complex DSBs, which were frequently produced after Fe-ion beams, were low.
会議概要(会議名, 開催地, 会期, 主催者等)
内容記述 日本放射線影響学会第65回大会
発表年月日
日付 2022-09-15
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