| アイテムタイプ |
学術雑誌論文 / Journal Article(1) |
| 公開日 |
2026-02-17 |
| タイトル |
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タイトル |
2D-RIXS: Resonant inelastic x-ray scattering microscopy with high energy and spatial resolutions |
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言語 |
en |
| 言語 |
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言語 |
eng |
| 資源タイプ |
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資源タイプ識別子 |
http://purl.org/coar/resource_type/c_6501 |
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資源タイプ |
journal article |
| 著者 |
Yamamoto Kohei
Hakuto Suzuki
Tohoku Univ.
Miyawaki Jun
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| 抄録 |
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内容記述タイプ |
Abstract |
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内容記述 |
A two-dimensional resonant inelastic X-ray scattering (2D-RIXS) microscopy system has been developed in NanoTerasu BL02U. This novel instrument uniquely combines a Wolter type-I mirror for spatial imaging with a high-performance varied-line-spacing grating spectrometer, achieving an unprecedented combination of micrometer-scale spatial resolution and meV-scale energy resolution in the soft x-ray regime. Test chart measurements confirm a vertical spatial resolution of 1.4um near the field-of-view center, currently limited by mirror alignment but consistent with simulations incorporating this effect. The system's remarkable RIXS imaging capabilities was demonstrated through measurements on a patterned Ni metal film and, notably, exfoliated NiPS3 nanoflakes, highlighting its efficiency in locating and characterizing specific microscale regions within inhomogeneous samples. These results establish 2D-RIXS microscopy as a powerful and efficient real-space probe, opening new avenues for investigating elementary excitations in complex quantum materials and functional devices where both high energy and spatial resolutions are crucial. |
| 書誌情報 |
Journal of Synchrotron Radiation
発行日 2026-01
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| 出版者 |
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出版者 |
John Wiley & Sons, Inc |
| DOI |
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識別子タイプ |
DOI |
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関連識別子 |
10.1107/S1600577526000573 |
