| アイテムタイプ |
学術雑誌論文 / Journal Article(1) |
| 公開日 |
2024-12-11 |
| タイトル |
|
|
タイトル |
Enhanced magnetometry with an electrically detected spin defect ensemble in silicon carbide |
|
言語 |
en |
| 言語 |
|
|
言語 |
eng |
| 資源タイプ |
|
|
資源タイプ識別子 |
http://purl.org/coar/resource_type/c_6501 |
|
資源タイプ |
journal article |
| 著者 |
C. T.-K. Lew
V. K. Sewani
N. Iwamoto
Ohshima Takeshi
J. C. McCallum
B. C. Johnson
|
| 抄録 |
|
|
内容記述タイプ |
Abstract |
|
内容記述 |
Spin defects in solid-state sensors are a highly promising platform for quantum sensing, a field with far-reaching applications in a variety of industries. Here, we investigate the magnetic sensitivity of a spin defect ensemble detected lectrically in a silicon carbide pn-junction diode utilizing the hyperfine-induced spin-mixing effect observed in the vicinity of zero magnetic field. To enhance the baseline sensitivity, we employ above bandgap optical excitation to generate additional electron-hole pairs as well as a balanced detection scheme to reject
common-mode noise, with an ultimate sensitivity of 30 nT/( Hz)1/2 achieved. Both techniques are demonstrated to greatly enhance the magnetic
sensitivity of the device by a total factor of 24, paving the way toward sub-nanotesla magnetic field sensitivities with electrical detection. |
| 書誌情報 |
Applied Physics Letters
巻 122,
p. 234001-1-234001-6,
発行日 2023-06
|
| 出版者 |
|
|
出版者 |
AIP publishing |
| ISSN |
|
|
収録物識別子タイプ |
ISSN |
|
収録物識別子 |
1077-3118 |
| DOI |
|
|
|
識別子タイプ |
DOI |
|
|
関連識別子 |
10.1063/5.0154382 |
