ログイン
Language:

WEKO3

  • トップ
  • ランキング
To
lat lon distance
To

Field does not validate



インデックスリンク

インデックスツリー

メールアドレスを入力してください。

WEKO

One fine body…

WEKO

One fine body…

アイテム

  1. 原著論文

Study on Resonance Phenomenon Caused by Voltage Fluctuation of Power Supply in JT-60SA EF Coil

https://repo.qst.go.jp/records/2000536
https://repo.qst.go.jp/records/2000536
0a806fc9-faf7-4f62-8cd8-ddf76797796d
アイテムタイプ 学術雑誌論文 / Journal Article(1)
公開日 2024-07-18
タイトル
タイトル Study on Resonance Phenomenon Caused by Voltage Fluctuation of Power Supply in JT-60SA EF Coil
言語 en
言語
言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_6501
資源タイプ journal article
著者 Sonoda Shogo

× Sonoda Shogo

Sonoda Shogo

Search repository
Nakamura Kazuya

× Nakamura Kazuya

Nakamura Kazuya

Search repository
Yuinawa Kotomi

× Yuinawa Kotomi

Yuinawa Kotomi

Search repository
Kobayashi Tomoka

× Kobayashi Tomoka

Kobayashi Tomoka

Search repository
Murakami Haruyuki

× Murakami Haruyuki

Murakami Haruyuki

Search repository
Hamada Kazuya

× Hamada Kazuya

Hamada Kazuya

Search repository
Hatakeyama Shoichi

× Hatakeyama Shoichi

Hatakeyama Shoichi

Search repository
Shimada Katsuhiro

× Shimada Katsuhiro

Shimada Katsuhiro

Search repository
抄録
内容記述タイプ Abstract
内容記述 For the large research Tokamak JT-60SA, evaluating thewithstand voltage between conductors is one of the most critical factors for the coil design. The power supply feeding the coil injects a wide spectrum of frequency components. The transient response and resonance phenomena induce a non-uniform voltage distribution in the coil. The transiently concentrated voltage can cause the insulation breakdown between conductors, and JT-60SA may not be able to operate safely. This study conducted an impulse test to evaluate the withstand voltage between adjacent conductors for an equilibrium field (EF) coil. The actual power supply voltage for the EF coil was measured to investigate the ramp rate (dv/dt) and frequency spectrum. In addition, based on the results of a resonance test of the EF dummy coil, a circuit simulation model for the EF coil was developed to evaluate the effect of the transient response and resonance phenomenon on the voltage in the coil. The results of this study provide fundamental data that can be used to ensure that the EF coil does not cause insulation breakdown.
書誌情報 IEEE Transactions on Applied Superconductivity

巻 33, 号 5, p. 4201104, 発行日 2023-02
出版者
出版者 IEEE
ISSN
収録物識別子タイプ ISSN
収録物識別子 1051-8223
DOI
識別子タイプ DOI
関連識別子 10.1109/TASC.2023.3250379
戻る
0
views
See details
Views

Versions

Ver.1 2025-08-15 02:22:58.220193
Show All versions

Share

Share
tweet

Cite as

Other

print

エクスポート

OAI-PMH
  • OAI-PMH JPCOAR 2.0
  • OAI-PMH JPCOAR 1.0
  • OAI-PMH DublinCore
  • OAI-PMH DDI
Other Formats
  • JSON
  • BIBTEX
  • ZIP

コミュニティ

確認

確認

確認


Powered by WEKO3


Powered by WEKO3