| アイテムタイプ |
学術雑誌論文 / Journal Article(1) |
| 公開日 |
2023-10-20 |
| タイトル |
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タイトル |
X-ray Two-beam Topography for Quantitative Derivation of Phase Shift by Crystalline Dislocations |
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言語 |
en |
| 言語 |
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言語 |
eng |
| 資源タイプ |
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資源タイプ識別子 |
http://purl.org/coar/resource_type/c_6501 |
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資源タイプ |
journal article |
| 著者 |
Yoshiki Kohmura
Ohwada Kenji
Nobuki Kakiuchi
Kei Sawada
Tadaaki Kaneko
Mizuki Junichiro
Masaicihro Mizumaki
Watanuki Tetsu
Tetsuya Ishikawa
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| 抄録 |
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内容記述タイプ |
Abstract |
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内容記述 |
Quantitative evaluation of crystalline dislocations is gaining importance for realizing functional materials with ultimately high performance. X-ray topography has been an important tool to evaluate them in large volume in bulk form, but the research up to now lacks the analysis to derive the phase at the image plane which prevents us to approach the details of lattice planes around crystalline dislocations. We here report a method that enables us such analysis in a crystal at the kinematic diffraction regime with a novel X-ray two-beam topography method. It can quantitatively derive the phase shift by the Bragg reflection around the crystalline dislocations. We verified the generation of an X-ray vortex wave field from a silicon carbide crystal containing a screw dislocation which agreed well with simulations. The precise lattice plane determination in a large field of view will clarify the configuration of various dislocations including screw dislocations that relieves the stress in the crystal. |
| 書誌情報 |
Physical Review Research
巻 5,
p. L012043,
発行日 2023-03
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| 出版者 |
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出版者 |
American Physical Society |
| ISSN |
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収録物識別子タイプ |
ISSN |
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収録物識別子 |
2643-1564 |
| DOI |
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識別子タイプ |
DOI |
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関連識別子 |
10.1103/PhysRevResearch.5.L012043 |
