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クラスタービーム照射・計測技術の開発
https://repo.qst.go.jp/records/82923
https://repo.qst.go.jp/records/82923fe68716b-fec6-4c93-ade6-707a6b3206a9
Item type | 一般雑誌記事 / Article(1) | |||||
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公開日 | 2021-06-03 | |||||
タイトル | ||||||
タイトル | クラスタービーム照射・計測技術の開発 | |||||
言語 | ||||||
言語 | jpn | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | article | |||||
アクセス権 | ||||||
アクセス権 | metadata only access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
著者 |
千葉, 敦也
× 千葉, 敦也× 山田, 圭介× 平野, 貴美× 鳴海, 一雅× 斎藤, 勇一× Atsuya, Chiba× Keisuke, Yamada× Yoshimi, Hirano× Kazumasa, Narumi× Yuichi, Saito |
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抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | A swift C60-ion microbeam apparatus for molecular imaging analysis of organic polymeric materials has been developed. A highly-intense negative C60 ion source has been installed on the 3-MV Tandem accelerator of TIARA, QST/Takasaki for this purpose as well as an electrostatic deflector. The microbeam with a size of one μm is successfully formed. Molecular images of a test sample are demonstrated. In addition, nonlinear effect on Au sputtering yields by Cn-ion (n =60 and 70) bombardment is discussed. | |||||
書誌情報 |
連携重点研究2020(令和2)年度成果報告書 発行日 2021-06 |
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関連サイト | ||||||
識別子タイプ | URI | |||||
関連識別子 | http://www.tokai.t.u-tokyo.ac.jp/kaihoken/seikahoukoku/seika2020/ |