{"created":"2023-05-15T15:01:07.583045+00:00","id":82923,"links":{},"metadata":{"_buckets":{"deposit":"17eb2ce9-a8bc-4411-9eca-8a31d66ef314"},"_deposit":{"created_by":1,"id":"82923","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"82923"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00082923","sets":["7"]},"author_link":["994491","994487","994492","994484","994488","994489","994490","994486","994493","994485"],"item_10004_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2021-06","bibliographicIssueDateType":"Issued"},"bibliographic_titles":[{"bibliographic_title":"連携重点研究2020（令和2）年度成果報告書"}]}]},"item_10004_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"A swift C60-ion microbeam apparatus for molecular imaging analysis of organic polymeric materials has been developed. A highly-intense negative C60 ion source has been installed on the 3-MV Tandem accelerator of TIARA, QST/Takasaki for this purpose as well as an electrostatic deflector. The microbeam with a size of one μm is successfully formed. Molecular images of a test sample are demonstrated. In addition, nonlinear effect on Au sputtering yields by Cn-ion (n =60 and 70) bombardment is discussed.","subitem_description_type":"Abstract"}]},"item_10004_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://www.tokai.t.u-tokyo.ac.jp/kaihoken/seikahoukoku/seika2020/","subitem_relation_type_select":"URI"}}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"千葉, 敦也"}],"nameIdentifiers":[{"nameIdentifier":"994484","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"山田, 圭介"}],"nameIdentifiers":[{"nameIdentifier":"994485","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"平野, 貴美"}],"nameIdentifiers":[{"nameIdentifier":"994486","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"鳴海, 一雅"}],"nameIdentifiers":[{"nameIdentifier":"994487","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"斎藤, 勇一"}],"nameIdentifiers":[{"nameIdentifier":"994488","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Atsuya, Chiba","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"994489","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Keisuke, Yamada","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"994490","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Yoshimi, Hirano","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"994491","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kazumasa, Narumi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"994492","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Yuichi, Saito","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"994493","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"クラスタービーム照射・計測技術の開発","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"クラスタービーム照射・計測技術の開発"}]},"item_type_id":"10004","owner":"1","path":["7"],"pubdate":{"attribute_name":"公開日","attribute_value":"2021-06-03"},"publish_date":"2021-06-03","publish_status":"0","recid":"82923","relation_version_is_last":true,"title":["クラスタービーム照射・計測技術の開発"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T20:05:37.150207+00:00"}