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Performance of a soft X-ray emission spectrometer with wideband multilayer optics in 1-3.5 keV region
https://repo.qst.go.jp/records/72294
https://repo.qst.go.jp/records/7229434e45df0-ee52-4042-a610-269acaf07943
Item type | 会議発表用資料 / Presentation(1) | |||||
---|---|---|---|---|---|---|
公開日 | 2017-04-24 | |||||
タイトル | ||||||
タイトル | Performance of a soft X-ray emission spectrometer with wideband multilayer optics in 1-3.5 keV region | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_c94f | |||||
資源タイプ | conference object | |||||
アクセス権 | ||||||
アクセス権 | metadata only access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
著者 |
今園, 孝志
× 今園, 孝志× 今園 孝志 |
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抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | A compact flat-field spectrometer in combination with a prefocusing mirror has been developed for the parallel detection of soft X-ray emission from 1 to 3.5 keV range. The spectroscopic coverage has been expanded due to aperiodic Ni/C multilayer coatings on a 2400 lines/mm grating and toroidal mirror. The multilayer structure is analogous to X-ray supermirrors, that consists of a C (1.12 nm)/Ni (4.48 nm) bilayer on an 80 pair of Ni (2.8 nm)/C (2.8 nm) bilayers; the topmost layer is Ni. These multilayer optical components were characterized with SR. In a preliminary test, the X-ray spectra from Pt, Ag, ITO, and CIS solar cell specimen were measured by using electron beam excitation. | |||||
会議概要(会議名, 開催地, 会期, 主催者等) | ||||||
内容記述タイプ | Other | |||||
内容記述 | International Conference on X-ray Optics and Applications (XOPT2017) | |||||
発表年月日 | ||||||
日付 | 2017-04-21 | |||||
日付タイプ | Issued |