{"created":"2023-05-15T14:52:58.403283+00:00","id":72294,"links":{},"metadata":{"_buckets":{"deposit":"05163b16-af3f-412a-a11b-964e62d52fba"},"_deposit":{"created_by":1,"id":"72294","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"72294"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00072294","sets":["10:28"]},"author_link":["712051","712052"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2017-04-21","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"A compact flat-field spectrometer in combination with a prefocusing mirror has been developed for the parallel detection of soft X-ray emission from 1 to 3.5 keV range. The spectroscopic coverage has been expanded due to aperiodic Ni/C multilayer coatings on a 2400 lines/mm grating and toroidal mirror. The multilayer structure is analogous to X-ray supermirrors, that consists of a C (1.12 nm)/Ni (4.48 nm) bilayer on an 80 pair of Ni (2.8 nm)/C (2.8 nm) bilayers; the topmost layer is Ni. These multilayer optical components were characterized with SR. In a preliminary test, the X-ray spectra from Pt, Ag, ITO, and CIS solar cell specimen were measured by using electron beam excitation. ","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"International Conference on X-ray Optics and Applications (XOPT2017)","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"今園, 孝志"}],"nameIdentifiers":[{"nameIdentifier":"712051","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"今園 孝志","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"712052","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"Performance of a soft X-ray emission spectrometer with wideband multilayer optics in 1-3.5 keV region","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Performance of a soft X-ray emission spectrometer with wideband multilayer optics in 1-3.5 keV region"}]},"item_type_id":"10005","owner":"1","path":["28"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-04-24"},"publish_date":"2017-04-24","publish_status":"0","recid":"72294","relation_version_is_last":true,"title":["Performance of a soft X-ray emission spectrometer with wideband multilayer optics in 1-3.5 keV region"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T19:41:33.013108+00:00"}