{"created":"2023-05-15T15:03:12.563946+00:00","id":85624,"links":{},"metadata":{"_buckets":{"deposit":"0dd49d43-3ee9-49e1-8b68-5f38d495f523"},"_deposit":{"created_by":1,"id":"85624","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"85624"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00085624","sets":["10:29"]},"author_link":["1030825","1030818","1030827","1030817","1030822","1030823","1030821","1030820","1030828","1030824","1030819","1030826"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2022-03-17","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"T’構造を有する電子ドープ型銅酸化物高温超伝導体は、母物質の反強磁性Mott絶縁体に電子キャリアをドープするだけでなく、還元処理によってAs-grown試料中に含まれる過剰酸素を除去することで超伝導が発現する。以前、適切に還元処理を行うことで過剰酸素が限りなく除去された母物質の薄膜で超伝導が発現し、注目を集めている。今回我々は、還元した試料のキャリアについて調べるために、単結晶試料を粉末で覆った状態でアニールを行うプロテクトアニールなどで超伝導を発現させた T’構造のPr1.3-xLa0.7CexCuO4 (PLCCO)のアンダードープ領域の単結晶を粉末化した試料を用いて、銅K端でのX 線吸収分光の測定を行った。その結果、プロテクトアニールでCuに電子が多くドープされて超伝導が発現し、高温と低温のアニールを繰り返すダイナミックアニールによってさらに電子が少量ドープされてTcが微増することがわかった。","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要(会議名, 開催地, 会期, 主催者等)","attribute_value_mlt":[{"subitem_description":"日本物理学会第77回年次大会","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"永久保, 侑祐"}],"nameIdentifiers":[{"nameIdentifier":"1030817","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"田島, 一輝"}],"nameIdentifiers":[{"nameIdentifier":"1030818","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"洲村, 拓哉"}],"nameIdentifiers":[{"nameIdentifier":"1030819","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"高濱 元史"}],"nameIdentifiers":[{"nameIdentifier":"1030820","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"谷口, 貴紀"}],"nameIdentifiers":[{"nameIdentifier":"1030821","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"浅野, 駿"}],"nameIdentifiers":[{"nameIdentifier":"1030822","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"石井, 賢司"}],"nameIdentifiers":[{"nameIdentifier":"1030823","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"松村, 大樹"}],"nameIdentifiers":[{"nameIdentifier":"1030824","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"辻, 卓也"}],"nameIdentifiers":[{"nameIdentifier":"1030825","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"桑原, 英樹"}],"nameIdentifiers":[{"nameIdentifier":"1030826","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"藤田, 全基"}],"nameIdentifiers":[{"nameIdentifier":"1030827","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kenji, Ishii","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1030828","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"X線吸収微細構造からみる電子ドープ型銅酸化物Pr1.3-xLa0.7CexCuO4のアンダードープ領域の電子状態","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"X線吸収微細構造からみる電子ドープ型銅酸化物Pr1.3-xLa0.7CexCuO4のアンダードープ領域の電子状態"}]},"item_type_id":"10005","owner":"1","path":["29"],"pubdate":{"attribute_name":"公開日","attribute_value":"2022-01-22"},"publish_date":"2022-01-22","publish_status":"0","recid":"85624","relation_version_is_last":true,"title":["X線吸収微細構造からみる電子ドープ型銅酸化物Pr1.3-xLa0.7CexCuO4のアンダードープ領域の電子状態"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T17:42:30.798487+00:00"}