{"created":"2023-05-15T15:03:08.878366+00:00","id":85544,"links":{},"metadata":{"_buckets":{"deposit":"5c9e3b88-3f29-45fd-8d9e-4ff57679c380"},"_deposit":{"created_by":1,"id":"85544","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"85544"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00085544","sets":["10:29"]},"author_link":["1030137","1030132","1030135","1030139","1030140","1030133","1030131","1030136","1030138","1030130","1030129","1030127","1030128","1030134"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2022-03-16","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"希土類モノプニクタイドNdBiは常磁性相でバンドギャップが負の Z2トポロジカル絶縁体となり、TN=24K以下の低温ではtype-Iのシンプルな反強磁性秩序を示すことから、磁性とトポロジーの相関の解明の研究に適した物質と考えられる。今回そこで Photon FactoryのBL-28において新たに開発されたマイクロ ARPES装置を用いて、反強磁性ドメインを分割したNdBiの電子状態測定を行った。その結果、反強磁性相において試料表面上の位置に依存してバンド分散が変化することを観測した。","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"日本物理学会 第 77 回年次大会（2022年）","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"本間, 飛鳥"}],"nameIdentifiers":[{"nameIdentifier":"1030127","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"高値, 大地"}],"nameIdentifiers":[{"nameIdentifier":"1030128","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"相馬, 清吾"}],"nameIdentifiers":[{"nameIdentifier":"1030129","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Yang, Y."}],"nameIdentifiers":[{"nameIdentifier":"1030130","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"中山, 耕輔"}],"nameIdentifiers":[{"nameIdentifier":"1030131","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"北村, 未歩"}],"nameIdentifiers":[{"nameIdentifier":"1030132","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"堀場, 弘司"}],"nameIdentifiers":[{"nameIdentifier":"1030133","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"組頭, 広志"}],"nameIdentifiers":[{"nameIdentifier":"1030134","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kim, T."}],"nameIdentifiers":[{"nameIdentifier":"1030135","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Cacho, C."}],"nameIdentifiers":[{"nameIdentifier":"1030136","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"安藤, 陽一"}],"nameIdentifiers":[{"nameIdentifier":"1030137","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"瀬川, 耕司"}],"nameIdentifiers":[{"nameIdentifier":"1030138","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"佐藤, 宇史"}],"nameIdentifiers":[{"nameIdentifier":"1030139","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Koji, Horiba","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1030140","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"マイクロARPESによる反強磁性体NdBiのドメイン依存ディラック表面状態","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"マイクロARPESによる反強磁性体NdBiのドメイン依存ディラック表面状態"}]},"item_type_id":"10005","owner":"1","path":["29"],"pubdate":{"attribute_name":"公開日","attribute_value":"2022-03-16"},"publish_date":"2022-03-16","publish_status":"0","recid":"85544","relation_version_is_last":true,"title":["マイクロARPESによる反強磁性体NdBiのドメイン依存ディラック表面状態"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T17:45:34.534160+00:00"}