{"created":"2023-05-15T15:02:31.879444+00:00","id":84786,"links":{},"metadata":{"_buckets":{"deposit":"adee77f4-eb69-4059-a75a-33f24be2ca99"},"_deposit":{"created_by":1,"id":"84786","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"84786"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00084786","sets":["1"]},"author_link":["1023051","1023054","1023053","1023058","1023056","1023050","1023052","1023059","1023060","1023055","1023057"],"item_8_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2022-01","bibliographicIssueDateType":"Issued"},"bibliographic_titles":[{"bibliographic_title":"IEEE Transactions on Magnetics"}]}]},"item_8_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Spin-driven thermoelectric (STE) generation based on the combination of the spin Seebeck effect and inverse spin Hall effect is alternative to conventional semiconductor-based thermocouples as it is large-scale, low-cost, and environment-friendly. The STE device is thought to be radiation hard, making it attractive for space and nuclear technology applications. By using magnetometry, transmission electron microscopy, and the hard X-ray photoemission spectroscopy (HAXPES) measurements, we show that a STE device made of single-crystalline Y3Fe5O12/Pt heterostructures has tolerance to irradiation of high-energy heavy ion beams. We used 200 MeV gold ion beams modeling cumulative damages due to fission products emitted from the surface of spent nuclear fuels. By varying the dose level, we confirmed that the thermoelectric and magnetic properties of the single-crystalline Y3Fe5O12/Pt STE device are finite at the ion-irradiation dose up to 1012 ions/cm2 fluence. In addition, the HAXPES measurements were performed to understand the effects at the interface of Y3Fe5O12/Pt. The HAXPES data suggest that the chemical reaction regarding Fe and O that diminishes the SSE signals is promoted with the increase of the irradiation dose. The understandings of the damage analysis in Y3Fe5O12/Pt are beneficial for developing better STE devices applicable to harsh environmental usages.","subitem_description_type":"Abstract"}]},"item_8_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_8_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1109/TMAG.2022.3145888","subitem_relation_type_select":"DOI"}}]},"item_8_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://ieeexplore.ieee.org/document/9691479","subitem_relation_type_select":"URI"}}]},"item_8_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1941-0069","subitem_source_identifier_type":"ISSN"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Jun'ichi, Ieda, "}],"nameIdentifiers":[{"nameIdentifier":"1023050","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Satoru, Okayasu"}],"nameIdentifiers":[{"nameIdentifier":"1023051","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kazuya, Harii"}],"nameIdentifiers":[{"nameIdentifier":"1023052","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kobata, Masaaki"}],"nameIdentifiers":[{"nameIdentifier":"1023053","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Yoshii, Kenji"}],"nameIdentifiers":[{"nameIdentifier":"1023054","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Fukuda, Tatsuo"}],"nameIdentifiers":[{"nameIdentifier":"1023055","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ishida, Masahiko"}],"nameIdentifiers":[{"nameIdentifier":"1023056","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Eiji, Saitoh"}],"nameIdentifiers":[{"nameIdentifier":"1023057","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Satoru, Okayasu","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1023058","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kazuya, Harii","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1023059","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Eiji, Saitoh","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1023060","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"The damage analysis for irradiation tolerant spin-driven thermoelectric device based on single-crystalline Y_3Fe_5O_12/Pt heterostructures","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"The damage analysis for irradiation tolerant spin-driven thermoelectric device based on single-crystalline Y_3Fe_5O_12/Pt heterostructures"}]},"item_type_id":"8","owner":"1","path":["1"],"pubdate":{"attribute_name":"公開日","attribute_value":"2022-01-11"},"publish_date":"2022-01-11","publish_status":"0","recid":"84786","relation_version_is_last":true,"title":["The damage analysis for irradiation tolerant spin-driven thermoelectric device based on single-crystalline Y_3Fe_5O_12/Pt heterostructures"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T18:11:51.123277+00:00"}