{"created":"2023-05-15T15:02:07.648605+00:00","id":84260,"links":{},"metadata":{"_buckets":{"deposit":"04bdfb34-fbfd-44c1-b9a0-f31ec26ccdb1"},"_deposit":{"created_by":1,"id":"84260","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"84260"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00084260","sets":["10:29"]},"author_link":["1017857","1017855","1017856","1017863","1017864","1017859","1017858","1017862","1017860","1017861"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2021-11-19","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Thomson scattering diagnostics provide electron temperature (Te) and density profiles in plasmas. They require measurements the scattered light, which are pulses with 10-100ns short, using fast digitizers. As a signal processing method for the fast digitizers, ”mode fitting” method is proposed for the switched-capacitor-type digitizers, such as CAEN V1742 and TechnoAP boards. ”Model fitting” is applied for a relatively low density LHD plasma. Te values and the magnitude of errors become small by this method. Simulating of signals with some noises based on the JT-60SA Thomson scattering system enables showing expected error in Te. The error can be suppressed by a model fitting method.","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"The 30th International Toki Conference","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Hisamichi, Funaba"}],"nameIdentifiers":[{"nameIdentifier":"1017855","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ichihiro, Yamada"}],"nameIdentifiers":[{"nameIdentifier":"1017856","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ryo, Yasuhara"}],"nameIdentifiers":[{"nameIdentifier":"1017857","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hiyori, Uehara"}],"nameIdentifiers":[{"nameIdentifier":"1017858","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hiroshi, Tojo"}],"nameIdentifiers":[{"nameIdentifier":"1017859","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Eiichi, Yatsuka"}],"nameIdentifiers":[{"nameIdentifier":"1017860","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Lee, Jong-ha "}],"nameIdentifiers":[{"nameIdentifier":"1017861","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Yuan , Huang"}],"nameIdentifiers":[{"nameIdentifier":"1017862","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hiroshi, Tojo","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1017863","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Eiichi, Yatsuka","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1017864","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"Fast signal modeling for Thomson scattering diagnostics and effects on electron temperature and density evaluation","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Fast signal modeling for Thomson scattering diagnostics and effects on electron temperature and density evaluation"}]},"item_type_id":"10005","owner":"1","path":["29"],"pubdate":{"attribute_name":"公開日","attribute_value":"2021-12-17"},"publish_date":"2021-12-17","publish_status":"0","recid":"84260","relation_version_is_last":true,"title":["Fast signal modeling for Thomson scattering diagnostics and effects on electron temperature and density evaluation"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T18:33:02.815392+00:00"}