{"created":"2023-05-15T15:01:17.795072+00:00","id":83156,"links":{},"metadata":{"_buckets":{"deposit":"f7cf2c71-d7c5-42b1-8319-c5d3a80f7580"},"_deposit":{"created_by":1,"id":"83156","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"83156"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00083156","sets":["10:28"]},"author_link":["996137","996136","996133","996134","996132","996135"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2021-07-07","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"⼤気マイクロPIXE（Particle Induced X-ray Emission）分析は、多元素の同時分析⼿法であり、大気環境中から捕集された⼤気中微粒⼦を１時間程度で測定できる。しかし、各元素の定量値を得るためには、X線エネルギースペクトルから背景雑⾳を分離しピークフィッティングすることが必要であり、その自動化が多数の大気環境試料の分析する際の課題である。そこで本研究では、重みつき⾮線形最⼩⼆乗法によるピークフィッティングを用いたピーク強度自動導出プログラムを開発した。しかし、一部の元素では、背景雑⾳を過少評価することに起因して誤差が大きくなることが分かった。今後、背景雑⾳の分離法を改良する予定である。","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"第58回アイソトープ・放射線研究発表会","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"臼井, 洸貴"}],"nameIdentifiers":[{"nameIdentifier":"996132","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"加田, 渉"}],"nameIdentifiers":[{"nameIdentifier":"996133","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"佐藤, 隆博"}],"nameIdentifiers":[{"nameIdentifier":"996134","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Koki, Usui","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"996135","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Wataru, Kada","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"996136","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Takahiro, Satoh","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"996137","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"短時間捕集大気中微粒子の多元素組成同時分析を可能にする大気マイクロPIXE分析とそのデータ解析手法の開発","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"短時間捕集大気中微粒子の多元素組成同時分析を可能にする大気マイクロPIXE分析とそのデータ解析手法の開発"}]},"item_type_id":"10005","owner":"1","path":["28"],"pubdate":{"attribute_name":"公開日","attribute_value":"2021-03-19"},"publish_date":"2021-03-19","publish_status":"0","recid":"83156","relation_version_is_last":true,"title":["短時間捕集大気中微粒子の多元素組成同時分析を可能にする大気マイクロPIXE分析とそのデータ解析手法の開発"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T19:58:11.662558+00:00"}