{"created":"2023-05-15T15:01:08.477479+00:00","id":82945,"links":{},"metadata":{"_buckets":{"deposit":"40f1fbef-4885-4850-a767-719ae5b6d950"},"_deposit":{"created_by":1,"id":"82945","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"82945"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00082945","sets":["1"]},"author_link":["1014920","1014922","1014924","1014918","1014923","1014917","1014921","1014919"],"item_8_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2021-07","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"26","bibliographicPageStart":"20","bibliographicVolumeNumber":"1","bibliographic_titles":[{"bibliographic_title":"ACS Measurement Science Au"}]}]},"item_8_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Determination of optimal measurement parameters is essential for measurement experiments. They can be manually optimized if the linear correlation between them and the corresponding signal quality is known or easily determinable. However, in practice, this correlation is often nonlinear and not known apriori; hence, complicated trial and error procedures are employed for finding optimal parameters while avoiding local optima. In this work, we propose a novel approach based on machine learning for optimizing multiple measurement parameters, which nonlinearly influence the signal quality. Optically detected magnetic resonance measurements of nitrogen-vacancy centers in fluorescent nanodiamonds were used as a proof-of-concept system. We constructed a suitable dataset of optically detected magnetic resonance spectra for predicting the optimal laser and microwave powers that deliver the highest contrast and signal-tonoise ratio values by means of linear regression, neural networks, and random forests. The model developed by the considered neural network turned out to have a significantly higher coefficient of determination than the other methods. The proposed method thus provided a novel approach for the rapid setting of measurement parameters that influence the signal quality in a nonlinear way, opening a gate for fields like nuclear magnetic resonance, electron paramagnetic resonance, and fluorescence microscopy to benefit from it","subitem_description_type":"Abstract"}]},"item_8_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"ACS"}]},"item_8_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1021/acsmeasuresciau.1c00009","subitem_relation_type_select":"DOI"}}]},"item_8_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://pubs.acs.org/doi/pdf/10.1021/acsmeasuresciau.1c00009","subitem_relation_type_select":"URI"}}]},"item_8_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2694-250X","subitem_source_identifier_type":"ISSN"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Takahiro, Fujisaku"}],"nameIdentifiers":[{"nameIdentifier":"1014917","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":" So, Frederick"}],"nameIdentifiers":[{"nameIdentifier":"1014918","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ryuji, Igarashi"}],"nameIdentifiers":[{"nameIdentifier":"1014919","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Masahiro, Shirakawa"}],"nameIdentifiers":[{"nameIdentifier":"1014920","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Takahiro, Fujisaku","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1014921","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":" So, Frederick","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1014922","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ryuji, Igarashi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1014923","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Masahiro, Shirakawa","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1014924","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Machine-Learning Optimization of Multiple Measurement Parameters Nonlinearly Affecting the Signal Quality","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Machine-Learning Optimization of Multiple Measurement Parameters Nonlinearly Affecting the Signal Quality"}]},"item_type_id":"8","owner":"1","path":["1"],"pubdate":{"attribute_name":"公開日","attribute_value":"2021-06-08"},"publish_date":"2021-06-08","publish_status":"0","recid":"82945","relation_version_is_last":true,"title":["Machine-Learning Optimization of Multiple Measurement Parameters Nonlinearly Affecting the Signal Quality"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T18:45:10.796583+00:00"}