{"created":"2023-05-15T15:00:46.855061+00:00","id":82456,"links":{},"metadata":{"_buckets":{"deposit":"b576038f-2218-45c1-8122-08e2f119fae9"},"_deposit":{"created_by":1,"id":"82456","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"82456"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00082456","sets":["1"]},"author_link":["1007368","1007369","1007372","1007373","1007370","1007367","1007371"],"item_8_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2020-07","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"3","bibliographicPageStart":"25","bibliographicVolumeNumber":"4","bibliographic_titles":[{"bibliographic_title":"Quantum Beam Science"}]}]},"item_8_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"粗大粒材の回折パターンは連続環ではないことから、シンクロトロンX線回折を利用した粗大粒材の応力測定は困難である。また、透過したX線ビームの回折パターンの中心部が不明であるという問題もある。ここでは、この問題への対策として、CdTeピクセル検出器を利用した二重露光法を提案する。CdTeピクセル検出器は新開発のエリア検出器であり、高エネルギーX線をエネルギー分解することができる。粗大粒材のひずみは、白色X線と二重露光法、および、CdTeピクセル検出器を組み合わせて測定できる。オーステナイト系ステンレス鋼板の曲げ応力を以上の方法で測定した結果、測定された応力は加えられた曲げ応力に対応していることが明らかになった。","subitem_description_type":"Abstract"}]},"item_8_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"10.3390/qubs4030025","subitem_relation_type_select":"DOI"}}]},"item_8_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://www.mdpi.com/2412-382X/4/3/25","subitem_relation_type_select":"URI"}}]},"item_8_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2412-382X","subitem_source_identifier_type":"ISSN"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Suzuki, Kenji"}],"nameIdentifiers":[{"nameIdentifier":"1007367","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ayumi, Shiro"}],"nameIdentifiers":[{"nameIdentifier":"1007368","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hidenori, Toyokawa"}],"nameIdentifiers":[{"nameIdentifier":"1007369","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Saji, Choji"}],"nameIdentifiers":[{"nameIdentifier":"1007370","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Shobu, Takahisa"}],"nameIdentifiers":[{"nameIdentifier":"1007371","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ayumi, Shiro","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1007372","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hidenori, Toyokawa","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1007373","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Double-Exposure Method with Synchrotron White X-ray for Stress Evaluation of Coarse-Grain Materials","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Double-Exposure Method with Synchrotron White X-ray for Stress Evaluation of Coarse-Grain Materials"}]},"item_type_id":"8","owner":"1","path":["1"],"pubdate":{"attribute_name":"公開日","attribute_value":"2021-03-24"},"publish_date":"2021-03-24","publish_status":"0","recid":"82456","relation_version_is_last":true,"title":["Double-Exposure Method with Synchrotron White X-ray for Stress Evaluation of Coarse-Grain Materials"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T19:16:25.290980+00:00"}