{"created":"2023-05-15T15:00:44.403223+00:00","id":82401,"links":{},"metadata":{"_buckets":{"deposit":"037937b9-f8c8-41e9-b55d-884d62d487a7"},"_deposit":{"created_by":1,"id":"82401","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"82401"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00082401","sets":["10:28"]},"author_link":["952018","952019","952027","952023","952025","952020","952028","952026","952021","952024","952022"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2020-12-15","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"JT-60SAでは電子温度と電子密度の分布を計測するためにトムソン散乱計測システムを設置する。本発表では、ポートプラグ内の限られた空間に設置可能な集光光学系、レーザー伝送系、分光器、制御システムの概念設計を示す。集光光学系はポートプラグからは独立した片持ち張り構造とし、ディスラプション等が原因となる変位の影響を抑制する。電子温度の計測誤差は、10%以下であると評価され、プラズマ研究に十分な精度で計測できる見込みを得た。","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"第23回高温プラズマ計測に関するトピカル会議(HTPD)","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Hiroshi, Tojo"}],"nameIdentifiers":[{"nameIdentifier":"952018","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Pasqualotto, Roberto"}],"nameIdentifiers":[{"nameIdentifier":"952019","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Fassina, Alessandro"}],"nameIdentifiers":[{"nameIdentifier":"952020","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Giudicotti, Leonardo"}],"nameIdentifiers":[{"nameIdentifier":"952021","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hajime, Sasao"}],"nameIdentifiers":[{"nameIdentifier":"952022","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hiroto, Homma"}],"nameIdentifiers":[{"nameIdentifier":"952023","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Naoyuki, Oyama"}],"nameIdentifiers":[{"nameIdentifier":"952024","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hiroshi, Tojo","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"952025","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hajime, Sasao","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"952026","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hiroto, Homma","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"952027","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Naoyuki, Oyama","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"952028","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"Design of JT-60SA core Thomson scattering diagnostic system","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Design of JT-60SA core Thomson scattering diagnostic system"}]},"item_type_id":"10005","owner":"1","path":["28"],"pubdate":{"attribute_name":"公開日","attribute_value":"2021-03-23"},"publish_date":"2021-03-23","publish_status":"0","recid":"82401","relation_version_is_last":true,"title":["Design of JT-60SA core Thomson scattering diagnostic system"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T20:08:11.603763+00:00"}