{"created":"2023-05-15T15:00:41.688629+00:00","id":82340,"links":{},"metadata":{"_buckets":{"deposit":"a9d512eb-6150-4930-b589-35641f5e9608"},"_deposit":{"created_by":1,"id":"82340","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"82340"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00082340","sets":["10:29"]},"author_link":["937622","937629","937626","937628","937624","937623","937627","937625"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2021-03-20","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Detectors based on solid state nuclear track detector chips, especially CR-39, are widely used in radon and thoron studies. They are usually in-situ exposed over a long period of time, from several days to several months where they may be subjected to the influence of external factors, like changing of temperature, humidity and pressure. \nOn the other hand, before experiments, detectors are sometimes stored for a long period of time and also exposure can last up to years. During this time, they are subject to changing environmental conditions which may have an impact to their performance in measuring radon. Evaluation of the exposed detectors involves chemical processing, whose conditions also influence the result. \nThe aim of this study was to check several factors, whether they may modify the response of CR-39 detector: concerning the phase before evaluation, storage time and temperature during storage; concerning the evaluation procedure, etching time and pre-etching treatment using hot water and carbon dioxide atmosphere.\nThree experiments were conducted by irradiation of CR-39 chips using alpha particles emitted from mono-energetic 241Am source and exposed in thoron atmosphere. \nTrack density dependence of the age of production was found to be statistically not significant. On the other hand, pre-etching treatment using hot water and carbon dioxide with different etching time showed statistically significant relationship between track size, sensitivity and roundness.","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"Third National Conference on Radiation Awareness and Detection in Natural Environment","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Janik, Miroslaw"}],"nameIdentifiers":[{"nameIdentifier":"937622","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Bossew, Peter"}],"nameIdentifiers":[{"nameIdentifier":"937623","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kovacs, Tibor"}],"nameIdentifiers":[{"nameIdentifier":"937624","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Mahamudul Hasan, MD"}],"nameIdentifiers":[{"nameIdentifier":"937625","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kavasi, Norbert"}],"nameIdentifiers":[{"nameIdentifier":"937626","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Janik, Miroslaw","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"937627","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Mahamudul Hasan, MD","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"937628","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kavasi, Norbert","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"937629","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"Evaluation of in-house treatment methods prior to etching CR-39 chips exposed to alpha particles","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Evaluation of in-house treatment methods prior to etching CR-39 chips exposed to alpha particles"}]},"item_type_id":"10005","owner":"1","path":["29"],"pubdate":{"attribute_name":"公開日","attribute_value":"2020-03-02"},"publish_date":"2020-03-02","publish_status":"0","recid":"82340","relation_version_is_last":true,"title":["Evaluation of in-house treatment methods prior to etching CR-39 chips exposed to alpha particles"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T20:28:53.849647+00:00"}