{"created":"2023-05-15T15:00:32.561560+00:00","id":82163,"links":{},"metadata":{"_buckets":{"deposit":"0f77c142-f821-401e-b7a1-040d34a1dd0d"},"_deposit":{"created_by":1,"id":"82163","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"82163"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00082163","sets":["10:29"]},"author_link":["936453","936452","936450","936449","936448","936451","936455","936454"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2021-01-12","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"ダイヤモンド中のNVセンターのマイナス荷電状態は２つの異なるスピン状態の間で蛍光強度に差を持つ(30％程度)。この特徴を使って、２つのスピン状態を重ねわせた時の蛍光強度によって外部場の検出をすることが可能である。また、その重ね合わせの保持時間(T2)は室温で最長であり、量子センサーへの応用研究が盛んに行われている。上述した蛍光強度の変化(蛍光コントラスト)をあげることは感度向上に大きく貢献する。一方で、コントラストを下げる要因であるNVセンターの中性荷電状態起因のバックラウンド蛍光が挙げられる。本研究では、NV-/NV0の比が材料の観点から何に律速しているかに着目した。結果として、ESR、PL分光を用いて、ダイヤモンド中の置換窒素濃度が荷電状態比の主な律速要因である実験結果を得た。","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"第34回　ダイヤモンドシンポジウム","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"真栄, 力"}],"nameIdentifiers":[{"nameIdentifier":"936448","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"宮川, 仁"}],"nameIdentifiers":[{"nameIdentifier":"936449","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"谷口, 尚"}],"nameIdentifiers":[{"nameIdentifier":"936450","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小野田, 忍"}],"nameIdentifiers":[{"nameIdentifier":"936451","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"石井, 秀弥"}],"nameIdentifiers":[{"nameIdentifier":"936452","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"寺地, 徳之"}],"nameIdentifiers":[{"nameIdentifier":"936453","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Shinobu, Onoda","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"936454","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Shuya, Ishii","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"936455","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"置換窒素(P1)と電子線照射による NV センター荷電状態比(NV-/NV0)制御","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"置換窒素(P1)と電子線照射による NV センター荷電状態比(NV-/NV0)制御"}]},"item_type_id":"10005","owner":"1","path":["29"],"pubdate":{"attribute_name":"公開日","attribute_value":"2021-03-15"},"publish_date":"2021-03-15","publish_status":"0","recid":"82163","relation_version_is_last":true,"title":["置換窒素(P1)と電子線照射による NV センター荷電状態比(NV-/NV0)制御"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T20:30:55.226374+00:00"}