@article{oai:repo.qst.go.jp:00080899,
 author = {Nagashima, Yoshihiko and Fujisawa, Akihide and Yamasaki, Kotaro and Inagaki, Shigeru and Moon, Chanho and Kin, Fumiyoshi and Kawachi, Yuichi and Arakawa, Hiroyuki and Yamada, Takuma and Kobayashi, Tatsuya and Kasuya, Naohiro and Kosuga, Yusuke and Sasaki, Makoto and Ido, Takeshi and Fumiyoshi, Kin},
 issue = {9},
 journal = {Journal of the Physical Society of Japan},
 month = {Nov},
 note = {Emission intensity ϵ from plasmas is a complicated function of electron temperature Te and electron density ne. To understand the dependence of ϵ on Te and ne, an experimental comparison between tomography data (local ϵ of ArII) and Langmuir probe data (Te and ne) in a linear plasma device PANTA is presented in this paper. In the comparison, the local emission intensity is modeled as ϵmodel∝Tαen2e, and the model is validated by calculating both cross-correlation function and least squares of residuals between the fluctuations of ϵ and ϵmodel. The comparison reveals that the both methods provide α = 2.3–2.7, higher than 2 that of the exponent of ne. This result confirms that dependence of Te on ϵ is larger than that of ne when Te is low, as in PANTA.},
 title = {Comparison between Tomography and Langmuir Probe Data in PANTA},
 volume = {89},
 year = {2020}
}