{"created":"2023-05-15T14:59:33.204115+00:00","id":80805,"links":{},"metadata":{"_buckets":{"deposit":"b5e9900c-0331-4d26-b400-fd4fabfc576c"},"_deposit":{"created_by":1,"id":"80805","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"80805"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00080805","sets":["2"]},"author_link":["895843","895844","895842","895845","895841","895840","895847","895839","895846"],"item_10003_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2020-10","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"319","bibliographicPageStart":"317","bibliographic_titles":[{"bibliographic_title":"Proceedings of the 17th Annual Meeting of Particle Accelerator Society of Japan"}]}]},"item_10003_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"同じ周波数ならば楕円空洞よりサイズが小さく、パッキングファクターにも優れるスポーク空洞の利点を生かしてERL 加速器を小型化し、LCS-γ/X線源を産業・学術分野への利用を図るため、超伝導スポーク空洞の開発を進めている。プレス加工したニオブ製のハーフスポークをフルスポークにするための電子ビーム溶接試験を行っている。スポークは形状が複雑な曲線で、プレス成型による板厚の違いがあるため、溶接個所により条件が変わる。溶接試験の現状について報告する。","subitem_description_type":"Abstract"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"沢村, 勝"}],"nameIdentifiers":[{"nameIdentifier":"895839","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"羽島, 良一"}],"nameIdentifiers":[{"nameIdentifier":"895840","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"佐伯学行"}],"nameIdentifiers":[{"nameIdentifier":"895841","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"岩下芳久"}],"nameIdentifiers":[{"nameIdentifier":"895842","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"頓宮, 拓"}],"nameIdentifiers":[{"nameIdentifier":"895843","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"中村哲朗"}],"nameIdentifiers":[{"nameIdentifier":"895844","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"渡邉直久"}],"nameIdentifiers":[{"nameIdentifier":"895845","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sawamura, Masaru","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"895846","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hajima, Ryoichi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"895847","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"超伝導スポーク空洞製作のための電子ビーム溶接試験","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"超伝導スポーク空洞製作のための電子ビーム溶接試験"}]},"item_type_id":"10003","owner":"1","path":["2"],"pubdate":{"attribute_name":"公開日","attribute_value":"2020-10-26"},"publish_date":"2020-10-26","publish_status":"0","recid":"80805","relation_version_is_last":true,"title":["超伝導スポーク空洞製作のための電子ビーム溶接試験"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T21:23:33.540115+00:00"}