{"created":"2023-05-15T14:59:33.160456+00:00","id":80804,"links":{},"metadata":{"_buckets":{"deposit":"b1b6318c-64b5-4cdb-95fe-4189c92fb69e"},"_deposit":{"created_by":1,"id":"80804","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"80804"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00080804","sets":["10:28"]},"author_link":["895830","895832","895836","895831","895837","895838","895833","895834","895835"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2020-08-04","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"同じ周波数ならば楕円空洞よりサイズが小さく、パッキングファクターにも優れるスポーク空洞の利点を生かしてERL 加速器を小型化し、LCS-γ/X線源を産業・学術分野への利用を図るため、超伝導スポーク空洞の開発を進めている。プレス加工したニオブ製のハーフスポークをフルスポークにするための電子ビーム溶接試験を行っている。スポークは形状が複雑な曲線で、プレス成型による板厚の違いがあるため、溶接個所により条件が変わる。溶接試験の現状について報告する。","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"第17回日本加速器学会年会","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"沢村, 勝"}],"nameIdentifiers":[{"nameIdentifier":"895830","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"羽島, 良一"}],"nameIdentifiers":[{"nameIdentifier":"895831","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"佐伯学行"}],"nameIdentifiers":[{"nameIdentifier":"895832","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"岩下芳久"}],"nameIdentifiers":[{"nameIdentifier":"895833","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"頓宮, 拓"}],"nameIdentifiers":[{"nameIdentifier":"895834","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"中村哲朗"}],"nameIdentifiers":[{"nameIdentifier":"895835","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"渡邉直久"}],"nameIdentifiers":[{"nameIdentifier":"895836","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sawamura, Masaru","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"895837","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hajima, Ryoichi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"895838","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"超伝導スポーク空洞製作のための電子ビーム溶接試験","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"超伝導スポーク空洞製作のための電子ビーム溶接試験"}]},"item_type_id":"10005","owner":"1","path":["28"],"pubdate":{"attribute_name":"公開日","attribute_value":"2020-05-08"},"publish_date":"2020-05-08","publish_status":"0","recid":"80804","relation_version_is_last":true,"title":["超伝導スポーク空洞製作のための電子ビーム溶接試験"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T21:23:34.187996+00:00"}