{"created":"2023-05-15T14:59:33.028554+00:00","id":80801,"links":{},"metadata":{"_buckets":{"deposit":"e42942fe-023a-493c-ac7d-6b7798d456f3"},"_deposit":{"created_by":1,"id":"80801","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"80801"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00080801","sets":["2"]},"author_link":["895824","895826","895828","895825","895829","895827"],"item_10003_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2020-10","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"709","bibliographicPageStart":"707","bibliographic_titles":[{"bibliographic_title":"Proceedings of the 17th Annual Meeting of Particle Accelerator Society of Japan"}]}]},"item_10003_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"TIARA AVFサイクロトロンでは効率的な入射調整のため、サイクロトロンのアクセプタンス測定技術の開発を行っている。この測定では、サイクロトロン内部で数十ピコアンペアから数ナノアンペアのビーム強度の測定が必要であるが、現在使用しているサイクロトロン内部の電流測定プローブではS/N比が低く、ナノアンペア以下の測定が困難であった。そこで、サイクロトロン内部のビーム位相測定に用いる平行平板型位相プローブ（電極間にビームが通過した際の静電誘導信号の位相からビーム位相を測定する装置）の電圧信号強度から上述の範囲のビーム強度測定が可能かを検証した。実験では、ビーム電流を入射ビームの時間幅制御により変え、位相プローブ出力電圧信号から高S/Nの周波数成分（加速RF周波数の6倍）を抽出してその強度を測定した。ビーム時間幅に対応するビーム電流値は電流測定プローブにより測定し、ナノアンペア以下のビーム電流は時間幅から算出した。その結果、4.8µAから70pA（ビーム時間幅制御の下限）まで、ビーム電流に比例した出力電圧信号が検出された。これにより、位相プローブを用いて、ナノアンペア以下のビームの強度が測定できることを確認した","subitem_description_type":"Abstract"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"柏木, 啓次"}],"nameIdentifiers":[{"nameIdentifier":"895824","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"宮脇, 信正"}],"nameIdentifiers":[{"nameIdentifier":"895825","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"倉島, 俊"}],"nameIdentifiers":[{"nameIdentifier":"895826","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kashiwagi, Hirotsugu","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"895827","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Miyawaki, Nobumasa","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"895828","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kurashima, Satoshi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"895829","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"Measurement of beam intensity using a phase probe in a cyclotron","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Measurement of beam intensity using a phase probe in a cyclotron"}]},"item_type_id":"10003","owner":"1","path":["2"],"pubdate":{"attribute_name":"公開日","attribute_value":"2020-10-26"},"publish_date":"2020-10-26","publish_status":"0","recid":"80801","relation_version_is_last":true,"title":["Measurement of beam intensity using a phase probe in a cyclotron"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T21:23:35.279689+00:00"}