@article{oai:repo.qst.go.jp:00080318,
 author = {Kawasaki, Hiromu and Tamura, Toshiki and Sunahara, Atsushi and Nishikino, Masaharu and Namba, Shinichi and Gerry, O’Sullivan and Higashiguchi, Takeshi and Nishikino, Masaharu},
 issue = {8},
 journal = {Review of Scientific Instruments},
 month = {Aug},
 note = {We evaluated the charge-separated spectra of highly charged suprathermal bismuth (Bi) ions from a dual laser-produced plasma soft x-ray source developed for soft x-ray microscopy. The charge distribution of these suprathermal ions emitted from a solid planar Bi target was measured by an electrostatic energy analyzer (ESA). The maximum ionic charge state was observed to be Z = 17 and to possess a maximum energy of about 200 keV. This evaluation provides important information essential for debris mitigation in a soft x-ray microscope.},
 title = {Charge-separated spectra of suprathermal highly charged bismuth ions in a dual laser-produced plasma soft x-ray source},
 volume = {91},
 year = {2020}
}