{"created":"2023-05-15T14:59:08.235618+00:00","id":80236,"links":{},"metadata":{"_buckets":{"deposit":"a26e9590-6761-43e2-9ecc-213e1e59c0e7"},"_deposit":{"created_by":1,"id":"80236","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"80236"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00080236","sets":["1"]},"author_link":["925454","925453"],"item_8_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2020-07","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"7・8","bibliographicPageEnd":"409","bibliographicPageStart":"399","bibliographicVolumeNumber":"69","bibliographic_titles":[{"bibliographic_title":"分析化学"}]}]},"item_8_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"1980年代にナノテクノロジーが材料開発のキーワードとして普及し始めた当初より，既に年々微細化しつつあった各種材料の分析手法探索とその高精度化は極めて重要な課題であった。この時期に急速に発展した放射光，荷電粒子等のいわゆる量子ビームを励起源として用いる技術はこれらの課題解決に極めて有効なツールである。本論文では，放射光のエネルギー可変性を利用し，通常より高い1.8～6.0 keVのX線を励起源として用いた高エネルギーX線光電子分光法により新たな非破壊深さ方向分析法を開発したこれまでの著者の研究を中心に新たな視点を加えつつ議論する。","subitem_description_type":"Abstract"}]},"item_8_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"10.2116/bunsekikagaku.69.399","subitem_relation_type_select":"DOI"}}]},"item_8_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://www.jstage.jst.go.jp/article/bunsekikagaku/69/7.8/69_399/_article","subitem_relation_type_select":"URI"}}]},"item_8_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0525-1931","subitem_source_identifier_type":"ISSN"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"山本, 博之"}],"nameIdentifiers":[{"nameIdentifier":"925453","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hiroyuki, Yamamoto","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"925454","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"放射光を用いる高エネルギーXPSによる表面ナノ領域の非破壊深さプロファイリング","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"放射光を用いる高エネルギーXPSによる表面ナノ領域の非破壊深さプロファイリング"}]},"item_type_id":"8","owner":"1","path":["1"],"pubdate":{"attribute_name":"公開日","attribute_value":"2020-02-28"},"publish_date":"2020-02-28","publish_status":"0","recid":"80236","relation_version_is_last":true,"title":["放射光を用いる高エネルギーXPSによる表面ナノ領域の非破壊深さプロファイリング"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T20:46:39.685581+00:00"}