@article{oai:repo.qst.go.jp:00080101,
 author = {Arai, Yoichi and Watanabe, Sou and Ohno, Shumpei and Nomura, Kazunori and Nakamura, Fumiya and Arai, Tsuyoshi and Seko, Noriaki and Hoshina, Hiroyuki and Hagura, Naoto and Kubota, Toshio and Seko, Noriaki and Hoshina, Hiroyuki},
 journal = {Nuclear Inst. and Methods in Physics Research B},
 month = {Jun},
 note = {Radioactive spent solvent waste containing U and Pu is generated from reprocessing process of spent nuclear fuel. The nuclear materials removal is important for safety storage or disposal. Imino diacetic acid (IDA) type chelating resin is promising adsorbent, and its characterization is performed by Particle Induced X-ray Emission (PIXE) and Extended X-ray Absorption Fine Structure (EXAFS) analyses on Zr in order to evaluate adsorption mechanism. PIXE succeeded in quantitative analysis on few micrograms of adsorbed Zr, and XAFS suggested that Zr in the aqueous solution and in the solvent can be trapped by IDA group with different mechanisms.},
 pages = {54--59},
 title = {Microscopic analyses on Zr adsorbed IDA chelating resin by PIXE and EXAFS},
 volume = {477},
 year = {2020}
}